Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-22T01:22:13.053Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Self-Organized Domains at the Micron Scale in Antiferromagnetic Elemental Cr Using Magnetic X-ray Microscopy

Published online by Cambridge University Press:  17 March 2011

P. G. Evans ,
E. D. Isaacs ,
G. Aeppli ,
Z.-H. Cai  and
B. Lai
P. G. Evans
Affiliation:
Bell Laboratories, Lucent Technologies, 600-700 Mountain Ave., Murray Hill, NJ 07974
E. D. Isaacs
Affiliation:
Bell Laboratories, Lucent Technologies, 600-700 Mountain Ave., Murray Hill, NJ 07974
G. Aeppli
Affiliation:
NEC Research Institute, 4 Independence Way, Princeton, NJ 08540
Z.-H. Cai
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439
B. Lai
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

The domains of antiferromagnetic order in elemental chromium can be observed with spatial resolution that is improved by orders of magnitude in comparison with previous techniques using magnetic x-ray scattering with an incident x-ray beam focused to a submicron spot. This use of magnetic x-ray microscopy takes advantage of the incommensurate spin density wave order in Cr to isolate magnetic scattering. The spin polarization dependence of the magnetic x-ray scattering cross section allows the first order spin-flip transition near 120 K to be imaged directly.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 690: Symposium F – Spintronics , 2001 , F8.6
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Fawcett, E., Rev. Mod. Phys. 60 209 (1988).Google Scholar
2 Baibich, M. N., Broto, J. M., Fert, A., Dau, F. Nguyen Van, Petroff, F., Eitienne, P., Creuzet, G., Friederich, A., and Chazelas, J., Phys. Rev. Lett. 61 2472 (1988); J. Nogués and I. K. Schuller, J. Magn. Magn. Mater. 192 203 (1999).Google Scholar
3 Lai, B., Yun, W.. Maser, J., Cai, Z., Rodrigues, W., Legnini, D., Chen, Z., Krasnoperova, A. A., Vladimirsky, Y., Cerrina, F., Fabrizio, E. Di, and Gentili, M., SPIE Proc. 3449 133 (1998).Google Scholar
4 Gibbs, D., Mohanty, K. M., and Bohr, J., Phys. Rev. B 37 (1988).Google Scholar
5 Platzman, P. M. and Tzoar, N., Phys. Rev. B 2 3556 (1970); M. Blume and D. Gibbs, Phys. Rev. B 37 1779 (1988).Google Scholar
6 Hill, J. P., Helgesen, G., and Gibbs, D., Phys. Rev. B 51 10336 (1995).Google Scholar
7 Evans, P. G., Isaacs, E. D., Aeppli, G., Cai, Z.-H., and Lai, B., in preparation.Google Scholar