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Epitaxial Phase Change Materials: Growth and Switching of Ge2Sb2Te5 on GaSb(001)

Published online by Cambridge University Press:  31 January 2011

Wolfgang Braun
Affiliation:
braun@pdi-berlin.de, Paul-Drude Institute for Solid State Electronics, Berlin, Germany
Roman Shayduk
Affiliation:
shayduk@pdi-berlin.de, Paul-Drude Institute for Solid State Electronics, Berlin, Germany
Timur Flissikowski
Affiliation:
flissi@pdi-berlin.de, Paul-Drude Institute for Solid State Electronics, Berlin, Germany
Holger T. Grahn
Affiliation:
htgrahn@pdi-berlin.de, Paul-Drude Institute for Solid State Electronics, Berlin, Germany
Henning Riechert
Affiliation:
riechert@pdi-berlin.de, Paul-Drude Institute for Solid State Electronics, Berlin, Germany
Paul Fons
Affiliation:
paul-fons@aist.go.jp, National Institute of Advanced Industrial Science and Technology, Center for Applied Near-Field Optics Research, Tsukuba, Japan
Alex Kolobov
Affiliation:
a.kolobov@aist.go.jp, National Institute of Advanced Industrial Science and Technology, Center for Applied Near-Field Optics Research, Tsukuba, Japan
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Abstract

Epitaxial Ge2Sb2Te5 has been successfully grown on GaSb(001) by molecular beam epitaxy. The films show a tendency for void formation and rough morphology, but at the same time a very strong epitaxial orientation, cubic structure and a sharp interface to the substrate. The layers can be reversibly switched between the crystalline and amorphous phases using short laser pulses.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

1 Meijer, G. I., Science 319, 1625 (2008).Google Scholar
2 Kolobov, A. V., Fons, P., Frenkel, A. I., Ankudinov, A. L., Tominaga, J. and Uruga, T., Nat. Mat. 3, 703 (2004).Google Scholar
3 Yamada, N. and Matsunaga, T., J. Appl. Phys. 88, 7020 (2000).Google Scholar
4 Raoux, S., Jordan-Sweet, J. L., Kellock, A. J., J. Appl. Phys. 103, 114310 (2008).Google Scholar
5 Braun, W., Shayduk, R., Flissikowski, T., Ramsteiner, M., Grahn, H. T., Riechert, H., Fons, P., Kolobov, A., Appl. Phys. Lett. 94, 041902 (2009).Google Scholar
6 Shayduk, R., Braun, W., J. Cryst. Growth, in press.Google Scholar
7 Jenichen, B., Braun, W., Kaganer, V. M., Shtukenberg, A. G., Däweritz, L., Schultz, C.-G., Ploog, K. H., Rev. Sci. Instrum. 74, 1267 (2003).Google Scholar