Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-17T23:33:21.692Z Has data issue: false hasContentIssue false

Effect of Impurity Ions and Permanent Dipoles for Device Performance of Thin-Film Electroluminescent Diodes

Published online by Cambridge University Press:  10 February 2011

Tetsuo Tsutsui
Affiliation:
Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816 Japan Tsutsui Team, CREST/JST, Kasuga, Fukuoka 816 Japan
Masayuki Yahiro
Affiliation:
Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816 Japan
Dechun Zou
Affiliation:
Tsutsui Team, CREST/JST, Kasuga, Fukuoka 816 Japan
Get access

Abstract

Double-layer EL diodes composed of a spin-coated Polyvinylcarbazole (PVCz) layer and a vacuum-sublimed tris-(8-hydroxyquinoline)aluminum (Alq) layer were prepared. The diodes with the same device structure but with PVCz layer with added ionic impurities were also prepared. The diodes were driven at constant voltage and allowed to stand under short-circuit or reverse bias conditions. Observations of luminance-current density-voltage relations at constant voltage driving were repeated. The decrease of both luminance and current density during constant voltage driving were observed. Both spontaneous and reverse-bias assisted recovery of device performances were observed and these degradation and recovery phenomena were discussed in terms of the movement of ionic impurities in organic layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Tsutsui, T. and Saito, S., in Intrinsically Conducting Polymer: An Emerging Technology, edited by Aldissi, M. (Kluwer Academic Pub., 1993) p. 123134.Google Scholar
2. Tsutsui, T., MRS Bulletin, 22(6), p. 39 (1997).Google Scholar
3. Adachi, C., Tsutsui, T. and Saito, S., Appl. Phys. Lett. 56, p.799 (1990).10.1063/1.103177Google Scholar
4. Do, L. M., Han, E. M., Niidome, Y., Fujihira, M., Kanno, T., Yoshida, S., Maeda, A. and Ikushima, A. J., J. Appl. Phys., 76, p. 5118 (1994).Google Scholar
5. Burrows, P. E., Bulvic, v. Forrest, S. R., Sapochak, L. S. McCarty, D. M. and Thompson, M. E., Appl. Phys. Lett., 65, p.2992 (1994).Google Scholar
6. Seats, J. R., Antoniadis, H., Hueschen, M., Leonard, W., Miller, J., Moon, R., Roitman, D. and Stocking, A., Science, 273, p.884 (1996).Google Scholar
7. Shirota, Y., Kuwabara, Y., Inada, H., Wakimoto, T., Nakada, H., Yonemoto, Y., Kawami, S. and Imai, K., Appl. Phys. Lett., 65, p.807 (1994).Google Scholar
8. Hamada, Y., Sano, T., Shibata, K. and Kuroki, K., Jpn. J. Appl. Phys. 34, p.L824 (1995).Google Scholar
9. Hamada, Y., Adachi, C., Tsutsui, T. and Saito, S., Jpn. J. Appl. Phys., 31, p. 1812 (1992).10.1143/JJAP.31.1812Google Scholar
10. Riess, W., in Organic Electroluminescence Materials and Devices, edited by Miyata, S. and Nalwa, H. S., (Gorden Breach Sci. Pub., 1997) p.73146.Google Scholar
11. Shi, J. and Tang, C. W., Appl. Phys. Lett., 70, p. 1665 (1997).Google Scholar