Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-19T10:40:40.272Z Has data issue: false hasContentIssue false

Control of Heteroepitaxy in Sol-Gel Derived LiNbO3 Thin Layers

Published online by Cambridge University Press:  15 February 2011

P.G. Clem
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Beekman Institute, University of Illinois at Urbana-Champaign, Urbana, IL 61801
D.A. Payne
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Beekman Institute, University of Illinois at Urbana-Champaign, Urbana, IL 61801
Get access

Abstract

Lithium niobáte (LiNDO3) in single crystal form is useful for the fabrication of acoustooptic and active waveguide devices. In this paper, the feasibility of integrating LiNbO3 thin layers on sapphire is reported. The performance of signal modulators, surface acoustic wave devices, and second harmonic generators relies on control of crystallographic orientation, so a thin-layer deposition method must meet high standards of crystallographic perfection and optical quality. Solution deposition of lithium niobium ethoxide was evaluated on (110) and (006) sapphire substrates for heteroepitaxy. Atomic force microscopy was used to determine the development of microstructure during the transition from the amorphous to crystalline state. Slab waveguides were formed and evaluated for optical quality and loss. Optical losses in the TEo mode of 500nm (110) LiNbO3 thin layers were determined to be 6 dB/cm. Preliminary results are given for the heteroepitaxial growth of α-Ga2O3 buffer layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Eichorst, D.J. and Payne, D.A., in Better Ceramics Through Chemistry III. (Mater. Res. Soc. Symp. 121, Pittsburgh, PA) 773 (1988)Google Scholar
2. Hirano, S. and Kato, H., Adv. Ceram. Mat. 3, 503 (1988)Google Scholar
3. Nashimoto, K. and Cima, M.J., Mater. Lett. 10, 348 (1991)Google Scholar
4. Joshi, V. and Mecartney, M.L., J. Mater. Res. 8(10), 2688 (1993)Google Scholar
5. Partlow, D.P. and Greggi, J., J. Mater. Res. 2(5), 595 (1987)Google Scholar
6. Nashimoto, K., in Ferroic Materials, Ceramic Transactions 43, 107 (1994)Google Scholar
7. Hagberg, D.S. and Payne, D.A., in Ferroelectric Thin Films, (Mater. Res. Soc. Symp. 200, Pittsburgh, PA) 19 (1990)Google Scholar
8. Hagberg, D.S., M.S. Thesis, University of Illinois at Urbana-Champaign (1991)Google Scholar
9. Miller, K.T. and Lange, F.F., J. Mater. Res. 6(11), 2387 (1991)Google Scholar
10. Walker, F.J., McKee, R.A., Yen, H.-W., and Zelmon, D.E., Appl. Phys. Lett. 65(12), 1495 (1994)Google Scholar
11. Prof. Holonyak, N., private communication (1994)Google Scholar
12. Geller, S., J. Chem. Phys. 33 (1960)Google Scholar
13. Kim, H.-G. and Kim, W.-T., J. Appl. Phys. 62(5), 2000 (1987)Google Scholar
14. Mehrotra, R.C. and Mehrotra, R.K., Current Sci. 33, 241 (1964)Google Scholar
15. Fork, D.K., Kingston, J.J., Anderson, G.B., Tarsa, E.J., and Speck, J.S., in Ferroelectric Thin Films III, (Mater. Res. Symp. Proc 310, Pittsburgh, PA) 113 (1993)Google Scholar