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The use of Electron Microscopy and Electron Diffraction in the Study of Phase Transformations

Published online by Cambridge University Press:  21 February 2011

S. Amelinckx ,
G. Van Tendeloo  and
J. Van Landuyt
S. Amelinckx
Affiliation:
University of Antwerp (RUCA) Groenenborgerlaan 171, B 2020-Antwerp, Belgium; Also at S.C.K., B 2400-MOL, Belgium
G. Van Tendeloo
Affiliation:
University of Antwerp (RUCA) Groenenborgerlaan 171, B 2020-Antwerp, Belgium;
J. Van Landuyt
Affiliation:
University of Antwerp (RUCA) Groenenborgerlaan 171, B 2020-Antwerp, Belgium;
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Extract

In recent years a separate branch of electron microscopy, which can conveniently be termed “Solid State Electron Microscopy” has evolved into a discipline of its own, which makes use of a set of techniques such as

- diffraction contrast electron microscopy

- high resolution transmission electron microscopy

- selected area electron diffraction

- convergent beam electron diffraction

- optical diffraction of high resolution electron micrographs

and which allows to provide information on a wide variety of solid state phenomena. With the availability of microscopes with a resolution equal to interatomic distances its field of application has recently been extended greatly.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 21: Symposium GREECE – Phase Transformations in Solids , 1983 , 85
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

1. Buerger, M.J., J.Chem.Phys. 15, 1 (1947).Google Scholar
2. Van Tendeloo, G. and Amelinckx, S., Acta Cryst. A30, 431 (1974).Google Scholar
3. Buxton, B.F., Fades, J.A., Steeds, J.W. and Rackham, J.M., Phil. Trans. Roy. Soc. 281, 171 (1976).Google Scholar
4. Van Landuyt, J. and Amelinckx, S. in : The Chemistry of Extended Defects, Eyring, L.R. and Keeffe, M.O., eds. (North Holland, Amsterdam 1970) p. 295.Google Scholar
5. Van Tendeloo, G., Delavignette, P., Gevers, R. and Amelinckx, S., Phys.Stat. Sol. (a) 18, 85 (1973).Google Scholar
6. Van Tendeloo, G. and Amelinckx, S., Phys. Stat. Sol. (a) 65, 431 (1981).Google Scholar
7. Meulemans, M., Delavignette, P., Garcia Gonzales, F. and Amelinckx, S., Mat. Res. Bull. 5, 1025 (1970).Google Scholar
8. Blank, H. and Amelinckx, S., Appl. Phys. Letters 2, 140 (1962).Google Scholar
9. Delavignette, P. and Amelinckx, S., Appl. Phys. Letters 2, 236 (1963).Google Scholar
10. Van Landuyt, J., Remaut, G. and Amelinckx, S., Phys. Stat. Sol. 41, 271 (1970).Google Scholar
11. Manolikas, C., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 53, 327 (1979).Google Scholar
12. Boulesteix, C., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 33, 595 (1976).Google Scholar
13. McMillan, W.L., Phys. Rev. B 14, 1496 (1976).Google Scholar
14. Walker, M.B., Phys. Rev. B 26, 6208 (1982).Google Scholar
14a Jacobs, A.E. and Walker, M.B., Phys. Rev. B 26, 206 (1982).Google Scholar
15. Fung, K.K., McKernan, S., Steeds, J.W. and Wilson, J.A., J. Phys. C. Solid State Phys. 14, 5417 (1981).Google Scholar
16. Chen, C.H., Gibson, J.M. and Fleming, R.M., Phys. Rev. Letters 47, 723 (1981).Google Scholar
17. Littlewood, P.B. and Rice, T.M., Phys. Rev. Letters 48, 27 (1982).Google Scholar
18. Amelinckx, S., Van Landuyt, J. and Van Tendeloo, G., NATO Institute Proceedings, Crete 1983 (in the press).Google Scholar
19. Van Landuyt, J. and Amelinckx, S., Mat. Res. Bull. 5, 267 (1970);Google Scholar
19a De Ridder, R., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 9, 551 (1972);Google Scholar
19b Van Landuyt, J. and Amelinckx, S., J. Solid State Chem. 6, 222 (1973);Google Scholar
19c Bursill, L.A., Hyde, B.G. and Philp, D.K., Phil. Mag. 273, 1501 (1971).Google Scholar
20. Alpress, J.G. and Gado, P., Cryst. Latt. Defects 70, 331 (1970).Google Scholar
21. Bursill, L.A. and Hyde, B.G., J. Solid State Chem. 4, 430 (1972).Google Scholar
22. Alpress, J.G., J. Solid State Chem. 4, 173 (1972).Google Scholar
23. Colaitis, D., Van Dyck, D. and Amelinckx, S., Phys. Stat. Sol. (a) 68, 419 (1981).Google Scholar
23a Van Tendeloo, G., Gregoriades, P. and Amelinckx, S. J. Solid State Chem. (in the press).Google Scholar
24. Snykers, M., Serneels, R., Delavignette, P., Gevers, R. and Amelinckx, S., Cryst. Lattice Defects 3, 99 (1972).Google Scholar
24a Snykers, M., Delavignette, P. and Amelinckx, S., Phys. Stat. Sol. (a) 48, K1 (1971).Google Scholar
25. Van Sande, M., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 55, 41 (1979).Google Scholar
25a Morton, A.J., Acta Met. 27, 863 (1979).Google Scholar
26. Van Landuyt, J., Van Tendeloo, G. and Amelinckx, S., Crystal Growth (in the press).Google Scholar
27. Van Landuyt, J., De Ridder, R., Gevers, R. and Amelinckx, S., Mat. Res. Bull. 5, 353 (1970).Google Scholar
27a De Ridder, R., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 9, 551 (1972).Google Scholar
28. Van Dyck, D., Colaitis, D. and Amelinckx, S., Phys. Stat. Sol. (a) 68, 385 (1981).Google Scholar
29. Amelinckx, S. and Van Landuyt, J. in “Diffraction and Imaging Techniques in Materials Science”, Amelinckx, S., Gevers, R. and Van Landuyt, J., eds. (North Holland Publishing Cy, Amsterdam 1978) p.107.Google Scholar
30. Van Landuyt, J., Gevers, R. and Amelinckx, S., Phys. Stat. Sol. 7, 519 (1964).Google Scholar
31. Serneels, R., Snykers, M., Delavignette, P., Gevers, R. and Amelinckx, S., Phys. Stat. Sol. (b) 58, 277 (1973).Google Scholar
32. Herremans, W., Gevers, R. and David, M., Phys. Stat. Sol. (a) 53, 327 (1979).Google Scholar
33. Manolikas, C., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 53, 327 (1979).Google Scholar
34. Van Landuyt, J., Van Tendeloo, G. and Amelinckx, S., Phys. Stat. Sol. (a) 26, 359 (1974);Google Scholar
34a Van Landuyt, J., Van Tendeloo, G. and Amelinckx, S., Phys. Stat. Sol. (a) 26, 585 (1974);Google Scholar
34b Van Landuyt, J., Van Tendeloo, G. and Amelinckx, S., Phys. Stat. Sol. (a) 36, 767 (1976);Google Scholar
34c Van Landuyt, J., Van Tendeloo, G. and Amelinckx, S., Phys. Stat. Sol. (a) 42, 565 (1977);Google Scholar
35. Van Tendeloo, G., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 64, K05 (1981).Google Scholar
36. Van Tendeloo, G., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 43, K137 (1977).Google Scholar
37. De Blieck, R., Wiegers, G., Van Dyck, D., Van Tendeloo, G., Van Landuyt, J. and Amelinckx, S., Proc. Second Eur. Conf. Solid State Chemistry. F II 16 (1982).Google Scholar
38. Cornelissens, T., Van Tendeloo, G., Van Landuyt, J. and Amelinckx, S., Phys. Stat. Sol. (a) 48, K5 (1978).Google Scholar
39. Manolikas, C. and Amelinckx, S., Phys. Stat. Sol. (a) 60, 607 (1980);Google Scholar
39a Manolikas, C. and Amelinckx, S., Phys. Stat. Sol. (a) 61, 179 (1980).Google Scholar
40. Manolikas, C. and Amelinckx, S., Phys. Stat. Sol. (a) 60, 167 (1980).Google Scholar
41. Sapriel, J., Phys. Rev. 12, 5128 (1975).Google Scholar
42. Vicens, J. and Delavignette, P., Phys. Stat. Sol. (a) 33, 497 (1976).Google Scholar
43. De Ridder, R., Van Tendeloo, G., Van Landuyt, J., Van Dyck, D. and Amelinckx, S., Phys. Stat. Sol. (a) 37, 591 (1976);Google Scholar
43a De Ridder, R., Van Tendeloo, G., Van Landuyt, J., Van Dyck, D. and Amelinckx, S., Phys. Stat. Sol. (a) 38, 185 (1976);Google Scholar
43b De Ridder, R., Van Tendeloo, G., Van Landuyt, J., Van Dyck, D. and Amelinckx, S., Phys. Stat. Sol. (a) 39, 383 (1977).Google Scholar
44. De Ridder, R., Van Tendeloo, G., Van Dyck, D. and Amelinckx, S., J. de Phys. Coll. C7, 38, 178 (1977).Google Scholar
45. Brown, B.E., Acta Cryst. 20, 264 (1966).Google Scholar
46. Brown, B.E., Acta Cryst. LO, 268 (1966).Google Scholar
47. Bjerkelund, E., Fermor, J. H. and Kjekhus, A., Acta Chem. Scand. 20, 1936 (1966).Google Scholar