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In situ Structural Study of Organic Semiconductor Thin Films

Published online by Cambridge University Press:  14 February 2012

Takuya Hosokai ,
Takeshi Watanabe ,
Tomoyuki Koganezawa ,
Jorg Ackermann ,
Hugues Brisset ,
Christine Videlot-Ackermann  and
Noriyuki Yoshimoto
Takuya Hosokai
Affiliation:
Department of Materials Science and Technology, Iwate University, 4-3-5 Ueda, Morioka, 0208551 Iwate, JAPAN
Takeshi Watanabe
Affiliation:
Department of Materials Science and Technology, Iwate University, 4-3-5 Ueda, Morioka, 0208551 Iwate, JAPAN
Tomoyuki Koganezawa
Affiliation:
Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, 6795198 Hyogo, JAPAN
Jorg Ackermann
Affiliation:
Ingénierie Moléculaire et Matériaux Fonctionnels, Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), CNRS-UPR-3118, Aix Marseille Université, Campus Luminy, Case 913, 13288 Marseille Cedex 09, FRANCE
Hugues Brisset
Affiliation:
Ingénierie Moléculaire et Matériaux Fonctionnels, Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), CNRS-UPR-3118, Aix Marseille Université, Campus Luminy, Case 913, 13288 Marseille Cedex 09, FRANCE
Christine Videlot-Ackermann
Affiliation:
Ingénierie Moléculaire et Matériaux Fonctionnels, Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), CNRS-UPR-3118, Aix Marseille Université, Campus Luminy, Case 913, 13288 Marseille Cedex 09, FRANCE
Noriyuki Yoshimoto
Affiliation:
Department of Materials Science and Technology, Iwate University, 4-3-5 Ueda, Morioka, 0208551 Iwate, JAPAN
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Abstract

A new class of high-vacuum organic deposition chamber was developed to study the structure and growth of organic semiconductor thin films. Using the chamber in situ real-time 2-dimensional grazing incidence x-ray diffraction (2D-GIXD) was measured during thin film growth of distyryl-oligothiophenes derivatives (DS2T) on SiO2 surface. An evolution of 2D-GIXD pattern was clearly observed during the growth due to the crystallization of the molecular domains consisting of standing-up orientation. A theoretical simulation on the experimental 2D-GIXD map provided a potential use of this system to determine the unit cell parameters in thin films. Thickness dependence and influence of air exposure on the film structure were also studied.

Keywords

x-ray diffraction (XRD)thin filmorganic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1402: Symposium U – Charge Generation/Transport in Organic Semiconductor Materials , 2012 , mrsf11-1402-u08-33
Copyright
Copyright © Materials Research Society 2012

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References

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