Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-18T01:15:41.798Z Has data issue: false hasContentIssue false

Homogeneity of Thermally-Annealed Lightly Fe-Doped SI InP

Published online by Cambridge University Press:  10 February 2011

M. Avella
Affiliation:
Dpto. Física de la Materia Condensada, ETSI Industriales, 47011 Valladolid, Spain
J. Jimenez
Affiliation:
Dpto. Física de la Materia Condensada, ETSI Industriales, 47011 Valladolid, Spain
R. Fornari
Affiliation:
MASPEC-CNR, Area delle Scienze 37/A, 43010 Fontanini, Parma, Italy
E. De La puente
Affiliation:
Dpto. Física de la Materia Condensada, ETSI Industriales, 47011 Valladolid, Spain
Get access

Abstract

Lightly Fe-doped semiconducting InP samples have been rendered semi-insulating by thermal annealing and subsequently studied by Hall effect, Scanning Photocurrent (SPC) and Scanning Photoluminescence (SPL). Hall measurement shows that the semi-insulating conversion is generally associated to an improvement of the mobility. SPL and SPC measurements show that the distribution of both electrically active iron and compensation ratio is homogeneous after annealing. The cooling rate was seen to influence the compensation ratio.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Fornari, R., Gilioli, E., Mignoni, G., Masi, M.; Cryst. Res. Technol. 32 (1997) 1085 Google Scholar
2. Avella, M., Jiménez, J., Alvarez, A., Fomari, R., Gilioli, E., A. Sentiri; J. Appl. Phys. 82 (1997) 3832 Google Scholar
3. Fornari, R.; Semicond. Sci. Technol. 14 (1999) 246 Google Scholar
4. Fornari, R., Zappettini, A., Gombia, E., Mosca, R., Cherkaoui, K., Marrakchi, G.; J. Appl. Phys 81 (1997) 7604 Google Scholar
5. Hirt, G., Wolf, D., Mueller, G.; J. Appl. Phys. 74 (1993) 5538 Google Scholar
6. Bliss, D. F., Bryant, G.G., Gabbe, D., Iseler, G., Hailer, E.E., Zach, F.X.; Proc. 7th Conf. on InP and Rel. Mater. 1995, IEEE, Library of Congr. No. 94–79424. p.678 Google Scholar
7. Zappettini, A., Fornari, R., Capelletti, R.; Mater. Sci. Eng. B45 (1997) 147 Google Scholar
8. Martín, P., Jiménez, J., González, M.A., Sanz, L. F., Chafai, M., Avella, M.; Mater. Sci. Eng. B20, (1993) 105 Google Scholar
9. Alvarez, A., Avella, M., J. Jiménez, M. González, R. Fornari; Semicond. Sci. Technol. 11 (1996) 941 Google Scholar
10. Longere, J., Schohe, K., Krawczyk, S., Coquille, R., L'Haridon, H., Favennec, P.; J. Appl. Phys 68 (1990) 755 Google Scholar
11. Fornari, R., Brinciotti, A., Gombia, E., Mosca, R., Sentiri, A.; Mater. Sci. Eng. B28 (1994)95 Google Scholar