Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-19T11:48:57.474Z Has data issue: false hasContentIssue false

High-Speed Solar-Blind AlGaN Schottky Photodiodes

Published online by Cambridge University Press:  01 February 2011

Necmi Biyikli
Affiliation:
Department of Electrical and Electronics Engineering, Bilkent University, Bilkent, Ankara, 06800 Turkey
Ibrahim Kimukin
Affiliation:
Department of Physics, Bilkent University, Bilkent, Ankara 06800 Turkey
Tolga Kartaloglu
Affiliation:
Department of Electrical and Electronics Engineering, Bilkent University, Bilkent, Ankara, 06800 Turkey
Orhan Aytür
Affiliation:
Department of Electrical and Electronics Engineering, Bilkent University, Bilkent, Ankara, 06800 Turkey
Ekmel Ozbay
Affiliation:
Department of Physics, Bilkent University, Bilkent, Ankara 06800 Turkey
Get access

Abstract

We report high-speed solar-blind AlGaN-based Schottky photodiodes. AlGaN/GaN heterostructure device layers were grown on sapphire substrate. The devices were fabricated on AlGaN/GaN heterostructuresusing a microwave compatible fabrication process. Schottky photodiodes with Au and indium-tin-oxide (ITO) Schottky contacts were fabricated. Current-voltage, spectral responsivity, and high-speed measurements were performed. Both Schottky samples exhibited very low sub-pA dark currents at high reverse bias. A bias dependent spectral responsivity was observed with a peak responsivity of 89 mA/W at 267 nm, and 44 mA/W at 263 nm for Au and ITO-Schottky devices respectively. Time-based high-frequency measurements at 267 nm resulted in pulse responses with rise times and pulse-widths as short as 13 ps and 74 ps respectively. The fastest solar-blind detector had a record 3-dB bandwidth of 1.10 GHz.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Razeghi, M. and Rogalski, A., J. Appl. Phys., 79, 7433 (1996).Google Scholar
[2] Schreiber, P., Dang, T., Smith, G., Pickenpaugh, T., Gehred, P., and Litton, C., Proc. SPIE, 3629, 230 (1999).Google Scholar
[3] Carrano, J. C., Li, T., Grudowski, P. A., Dupuis, R. D., and Campbell, J. C., IEEE Circuits & Devices Mag., 15, 15 (1999).Google Scholar
[4] Walker, D., Kumar, V., Mi, K., Sandvik, P., Kung, P., Zhang, X. H., and Razeghi, M., Appl. Phys. Lett., 76, 403 (2000).Google Scholar
[5] Kuryatkov, V. V., Temkin, H., Campbell, J. C., and Dupuis, R. D., Appl. Phys. Lett,. 78, 3340 (2001).Google Scholar
[6] Hirano, A., Pernot, C., Iwaya, M., Detchprohm, T., Amano, H., and Akasaki, I., Phys. Stat. Sol. (A), 188, 293 (2001).Google Scholar
[7] Li, T., Lambert, D. J. H., Beck, A. L., Collins, C. J., Yang, B., Wong, M. M., Chowdhury, U., Dupuis, R. D., and Campbell, J. C., Electron. Lett., 36, 1581 (2000).Google Scholar
[8] Collins, C. J., Chowdhury, U., Wong, M. M., Yang, B., Beck, A. L., Dupuis, R. D., and Campbell, J. C., Appl. Phys. Lett. 80, 3754 (2002).Google Scholar
[9] Wang, S. Y., and Bloom, D. M., Electron. Lett., 19, 554 (1983).Google Scholar
[10] Parker, D. G., Say, P. G., and Hansom, A. M., Electron. Lett., 23, 527 (1987).Google Scholar
[11] Biyikli, N., Kimukin, I., Aytur, O., Gokkavas, M., Unlu, M. S., and Ozbay, E., IEEE Photon. Technol. Lett., 13, 705 (2001).Google Scholar
[12] Osinsky, A., Gangopadhyay, S., Lim, B. W., Anwar, M. Z., Khan, M. A., Kuksenkov, D. V., and Temkin, H., Appl. Phys. Lett., 72, 742 (1998).Google Scholar
[13] Rumyantsev, S. L., Pala, N., Shur, M. S., Gaska, R., Levinshtein, M. E., Adivarahan, V., Yang, J., Simin, G., and Khan, M. Asif, Appl. Phys. Lett., 79, 866 (2001).Google Scholar
[14] Carrano, J. C., Li, T., Brown, D. L., Grudowski, P. A., Eiting, C. J., Dupuis, R. D., and Campbell, J. C., Appl. Phys. Lett., 73, 2405 (1998).Google Scholar
[15] Biyikli, N., Kartaloglu, T., Aytur, O., Kimukin, I., and Ozbay, E., Appl. Phys. Lett., 79, 2838 (2001).Google Scholar
[16] Biyikli, N., Aytur, O., Kimukin, I., Tut, T., and Ozbay, E., Appl. Phys. Lett., 81, 3272 (2002).Google Scholar