Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-19T11:42:03.024Z Has data issue: false hasContentIssue false

Extended X-Ray Absorption Fine Structure Studies of MnZn-Ferrite Films

Published online by Cambridge University Press:  15 February 2011

Paul C. Dorsey
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375-5000
Vincent G. Harris
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375-5000
Douglas B. Chrisey
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375-5000
Peter Lubitz
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375-5000
James S. Horwitz
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375-5000
Norman C. Koon
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375-5000
Get access

Abstract

The magnetic properties of MnZn-ferrite are greatly affected by the distribution and valence state of the magnetic and nonmagnetic metallic ions on the tetrahedral (A) and octahedral (B) sites in the spinel ferrite unit cell. A primary factor which can affect the distribution and valence state of the metallic ions is the stoichiometry of the ferrite. In this paper we report on the results of the site occupancy of the transition metal ions in a series of MnZn-ferrite films using extended x-ray absorption fine structure (EXAFS). The EXAFS data are correlated with the film composition and those magnetic properties which are sensitive to the ionic distribution (e.g., magnetic anisotropy field and magnetization) in order to confirm the use of EXAFS as a technique for the investigation of metallic ion distribution in spinel ferrites.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Williams, C. M., Chrisey, D. B., Lubitz, P., Grabowski, K. S., and Cotell, C. M., J. Appl. Phys. 75, 1676 (1994).Google Scholar
[2] Neiser, R. A.. Kirkland, J. P., Elam, W. T., and Sampath, S., Nucl. Instrm. Methods Phys. Res. Sect. A 266, 220 (1988).Google Scholar
[3] Elam, W. T., Kirkland, J. P., Neiser, R. A. and Wolf, P. D., Phys. Rev. B, 38, 26 (1988).Google Scholar
[4] Sayers, D. E. and Bunker, B. A., in X-ray Absorption: Basic Principles of EXAFS, SEXAFS, and XANES, Koningsberger, D. C. and Prins, R. (editors), (Wiley, New York, 1988).Google Scholar
[5] Rehr, J. J., Leon, J. Mustre de, Zabinsky, S. I., Albers, R. C., J. Amer. Chem. Soc 113, 5135 (1991).Google Scholar
[6] Aulock, W. H. von, Handbook of Microwave Ferrite Materials, (Academic Press, New York, 1965).Google Scholar