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Estimation of The Critical Radius for The Nucleation of the C54 Phase in C49 TiSi2: Role of The Difference in Density

Published online by Cambridge University Press:  15 February 2011

D.B. Migas ,
M. Iannuzzi ,
Leo Miglio ,
F. La Via  and
M.G. Grimaldi
D.B. Migas
Affiliation:
INFM and Dipartimento di Scienza dei Materiali della Università di Milano-Bicocca, via Cozzi 53, 20125, MILANO, Italy
M. Iannuzzi
Affiliation:
INFM and Dipartimento di Scienza dei Materiali della Università di Milano-Bicocca, via Cozzi 53, 20125, MILANO, Italy
Leo Miglio
Affiliation:
INFM and Dipartimento di Scienza dei Materiali della Università di Milano-Bicocca, via Cozzi 53, 20125, MILANO, Italy
F. La Via
Affiliation:
CNR-IMETEM, Stradale Primosole 50, 95121 CATANIA, Italy
M.G. Grimaldi
Affiliation:
INFM and Dipartimento di Fisica della Universiti di Catania, Corso Italia 57, 95129 CATANIA, Italy
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Abstract

We discuss the rather scattered measurements of the lattice parameters for C49 TiSi2, which are reported in literature, along with new and accurate X-ray diffraction measurements and ab-initio calculations. Both agree in indicating that the density of the metastable C49 structure cannot be much smaller than the one for the polymorphic C54 phase, as it is commonly reported. We conclude by demonstrating that only in the case of such a smaller difference in density between the two phases, the elastic strain contribution to the nucleation energy of the C54 structure in the C49 matrix can be neglected. The estimation of the critical radius strongly depends on this issue.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 580: Symposium E – Nucleation & Growth Processes in Materials , 1999 , 129
Copyright
Copyright © Materials Research Society 2000

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References

1. Harper, J.M.E., Rodbell, K.P., J.Vac.Sci.Technol.B 15, 763 (1997).Google Scholar
2. Quilici, S., Meinardi, F., Sobbadini, A., Solid State Communication 109/3, 141 (1999).Google Scholar
3. Ma, Z. and Allen, L.H., Phys.Rev.B 49, 13501 (1994).Google Scholar
4. Cotter, P.G., Kohn, J.A., Potter, R.A., J.Am.Ceram.Soc. 39, 11 (1956).Google Scholar
5. Joint Commettee on Powder Diffraction Standards, File 10-255.Google Scholar
6. Kopylova, V.P., Nazarchuk, T.N., INDUSTRIAL LABORATORY, 43 (4), 485–487 (1997).Google Scholar
7. d'Heurle, F.M., Gas, P., Engstrom, I., Nygem, S., Ostling, M., Petersson, C.S., IBM Research Reports RC11151 (1987).Google Scholar
8. Beyers, R., Sinclair, R., J.Appl. Phys. 57, 524 (1985).Google Scholar
9. Jongste, J.F., Loopstra, O.B., Janssen, G.C.A.M., Radelaar, S., J.Appl. Phys 73, 2816 (1983)Google Scholar
10. Pearson, W.B., A Handbook of Lattice Spacings and Structures of Metals and Alloys (Pergamon, New York, 1967), Vol.2.Google Scholar
11. Rozenkranz, R., Frommeyer, G., Z. Metallkd. 83, 9 (1992).Google Scholar
12. Kresse, G., Hafner, J., Phys. Rev. B 49, 14251 (1994);Google Scholar
Kresse, G., Futhmuller, J., Comput. Mater. Sci. 6, 15 (1996);Google Scholar
Kresse, G., Futhmuller, J., Phys. Rev. B 54, 11169 (1996).Google Scholar
13. Ceperly, D.M., Alder, B.J., Phys.Rev.Lett. 45, 566 (1980).Google Scholar
14. Perdew, J., Zunger, A., Phys. Rev B 23, 5048 (1981).Google Scholar
15. Perdew, J., Wang, Y., Phys. Rev B 45, 13244 (1992).Google Scholar
16. Vanderbilt, D., Phys. Rev. B 41, 7892 (1990);Google Scholar
Kresse, G., Hafner, J., J. Phys: Condens Mater 6, 8245 (1994).Google Scholar
17. Ekrnan, M., Ozolins, V., Phys Rev. B 57, 4419 (1998).Google Scholar
18. Ravindran, P., Fast, L., Korzhavyj, P.A., Johansson, B., Wills, J., Eriksson, O., J.Appl. Phys 84, 4891 (1998).Google Scholar
19. Osting, M. and Zaring, C. in Properties of Metal Silicides, edited by Maex, K. and van Rossum, M. (EMIS Datareviews Series No. 14) pp. 15–45.Google Scholar
20. Ianuzzi, M., Miglio, L., Celino, M., submitted to Phys.Rev.B.Google Scholar
21. Miglio, L., Iannuzzi, M., Grimaldi, M.G., Via, F.La, Marabelli, F., Bocelli, S., Santucci, S., Phani, A.R., Solid State Electronics 43, 1069 (1999).Google Scholar