Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-11T03:25:20.908Z Has data issue: false hasContentIssue false

The Determination of the Oxygen Stoichiometry in High TC Superconducting Thin Films Using Nuclear Scattering of 3 Mev Protons

Published online by Cambridge University Press:  28 February 2011

H.-S. Jin
Affiliation:
Deparrment of Physics, Brooklyn College of The City University of New York, Brooklyn, New York, 11210
H. Homma
Affiliation:
Deparrment of Physics, Brooklyn College of The City University of New York, Brooklyn, New York, 11210
D. Yan
Affiliation:
Deparrment of Physics, Brooklyn College of The City University of New York, Brooklyn, New York, 11210
A.J. Drehman
Affiliation:
Solid State Sciences Directorate, Rome Air Development Center, Hanscom AFB, MA 01731
G.-C. Wang
Affiliation:
Department of Physics, Rensselaer Polytechnic Institute, Troy, New York, 12181
Get access

Abstract

The nuclear scattering of 3 MeV protons on oxygen is applied to determine the oxygen stoichiometry in high Tc superconducting (HTS) thin films. Their oxide substrates are used as reference standards. This is a nondestructive, absolute method, which is as simple as the traditional Rutherford Backscattering Spectrometry (RBS). However, the relative sensitivity to oxygen has been enhanced. To obtain the stoichiometry, one only needs the data on atomic stopping powers and the chemical composition of the substates.When the measurements on the thin film and on the substate are carried out simultaneously, the inaccuracy in charge integration can be avoided and the accuracy of the oxygen stoichiometry can be further improved.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. For example, Laibowitz, R.B., MRS Bull. 14 No.l 58 (1989).Google Scholar
2. Tarason, J‐M. and Bagley, B.G., MRS Bull., 14 No.l 53 (1989).Google Scholar
3. For example, Tarason, J‐M. et al. , in Noval Superconductivity, Stuart wolf and Vladimir, A., Krezin, Z. eds., (Plenum Press, N.Y.1987) p. 705.Google Scholar
4. Strauven, H. et al. , Sol. St. Comm. 65 293 (1988); Locquet, J.P. et al. , Proceedings of the Conference on High Temperature Supereconductivity and Materials and Mechanisms of Superconductivity, Interlaken, Switzerland, (in press).Google Scholar
5. For example, Chang, C.C., in Characterization of Solid Surface, edited by Kane, P.F. and Larrabee, G.B., (Plenum, New York, 1974), Chap. 20.Google Scholar
6. For example, Birks, L.S., Electron Probe Microanalvsis. (John Wiley, New York, 1963).Google Scholar
7. Yang, K.Y., Homma, H., Lee, R., Bhadra, R., Grimsditch, M., Bader, S., Loquet, J.P., Bruynserade and Ivan, Y. Schuller, K., Appl. Phys. Lett. 53 808 (1988).Google Scholar
8. Jorgensen, J. et al. , Phys. Rev. B36 3608 (1987)Google Scholar
9. Demazeau, G., Marty, J.L., Buffat, B., Dance, J.M., Pouchard, M., Dardov, P. and Chevalier, B., MRS Bull.,17 37 (1982).Google Scholar
10. Hong, M., Liou, S.H., Kwo, J. and Davision, B.A., Appl. Phys. Lett. 51 694 (1987).Google Scholar
11. Lathrop, D.K., Russek, S.E. and Buhrman, R.A., Appl. Phys. Lett. 51 1554 (1987).Google Scholar
12. Narayan, J., Bianno, N., Singh, R., Holland, O.W. and Auciello, O. Appl. Phys. Lett. 51 1845 (1987).Google Scholar
13. Luomajarvi, M., Rauhala, E. and Hautala, M., Nucl. Instr. & Methd. B9 255 (1985).Google Scholar
14. Jarmie, N. and Seagrave, J.D., Los Alamos Report LA‐2014 (1957).Google Scholar
15. The Stopping and Ranges of Ions in Matter, vol.3, Andersen, H.H. and Ziegler, J.F., eds., (Pergamon Press, New York, 1977).Google Scholar