Hostname: page-component-5c6d5d7d68-lvtdw Total loading time: 0 Render date: 2024-08-08T09:58:14.910Z Has data issue: false hasContentIssue false
  • English
  • Français

Ab Initio XAFS and XANES Standards

Published online by Cambridge University Press:  15 February 2011

J. J. Rehr ,
S. I. Zabinsky  and
R. C. Albers
J. J. Rehr
Affiliation:
Department of Physics, FM-15, Seattle, WA 98195
S. I. Zabinsky
Affiliation:
Department of Physics, FM-15, Seattle, WA 98195
R. C. Albers
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545
Get access

Abstract

Ab initio x-ray-absorption fine structure (XAFS) and x-ray-absorption near edge structure (XANES) standards are developed for molecules and solids. These standard XAFS spectra are obtained from ab initio XAFS calculations, using an automated code, FEFF, which we have extended to include multiple-scattering (MS) and XANES calculations. Our treatment is based on state-of-the-art curved-wave MS theory. Sample results are presented and compared with experiment. We find that these theoretical standards are comparable with experimental measurements, yielding distance determinations better than 0.02 Å and coordination numbers better than 20%. Our approach also gives a new MS interpretation of the σ* shape-resonances in XANES.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 3
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Schaich, W. L., Phys. Rev. B 8, 4028 (1973); P. A. Lee and J. B. Pendry, Phys. Rev. B 11, 2795 (1975); J. J. Barton and D. A. Shirley, Phys. Rev. B 32, 1906 (1985).CrossRefGoogle Scholar
2. Rehr, J. J., Mustre de Leon, J., Zabinsky, S. I., and Albers, R. C., J. Am. Chem. Soc 113, 5135 (1991); J. Mustre de Leon, J. J. Rehr, S. I. Zabinsky and R. C. Albers, Phys. Rev. B 44, 4146 (1991).CrossRefGoogle Scholar
3. Rehr, J.J., Albers, R.C., and Zabinsky, S.I., Phys. Rev. Lett. 69, 3397 (1992).CrossRefGoogle Scholar
4. Rehr, J.J., Proceedings of XAFS VII, Japan J. Appl. Phys. (in press 1993).Google Scholar
5. Rehr, J. J., Albers, R. C., Natoli, C. R., and Stern, E. A. Phys. Rev. B 34, 4350 (1986).CrossRefGoogle Scholar
6. Rehr, J. J. and Albers, R. C., Phys. Rev. B 41, 8139 (1990).CrossRefGoogle Scholar
7. Albers, R. C., McMahan, A. K., and Müller, J. E., Phys. Rev. B 31, 3435 (1985).CrossRefGoogle Scholar
8. Stöhr, J. and Bauchspeiss, K. R., Phys. Rev. Lett. 67, 3376 (1991).CrossRefGoogle Scholar
9. Natoli, C. R., EXAFS and Near Edge Structure, edited by Bianconi, A. et at. (Springer, New York 1983), p. 43.CrossRefGoogle Scholar
10. Those interested in obtaining our XAFS codes FEFF© should contact the authors.Google Scholar