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Development of Nonpolar and Semipolar InGaN/GaN Visible Light-Emitting Diodes

Published online by Cambridge University Press:  31 January 2011

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Abstract

This article reviews the development of nonpolar and semipolar InGaN/GaN light-emitting diodes (LEDs), emphasizing structures on freestanding bulk GaN. A brief history of LED development on each orientation is provided, followed by a discussion of the most relevant and recent results. The context is related to several current LED issues, such as the realization of high-efficiency white solid-state lighting, potential solutions to the “green gap,” and applications for polarized emitters. The section on nonpolar LEDs highlights high-power violet and blue emitters and considers the effects of indium incorporation and substrate miscut. The section on semipolar GaN reviews the development of LEDs in the violet, blue, green, and yellow regions and highlights the potential of InGaN/GaN LEDs as an alternative technology to AlInGaP for yellow emitters. A brief review of polarization anisotropy also is included for each orientation. Finally, a two source white light system utilizing a nonpolar blue LED and a semipolar yellow LED is presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

1Krames, M.R., Shchekin, O.B., Muller-Mach, R., Mueller, G.O., Zhou, L., Harbers, G., Craford, M.G., J. Disp. Technol. 3, 160 (2007).CrossRefGoogle Scholar
2Humphreys, C.J., MRS Bull. 33, 459 (2008).CrossRefGoogle Scholar
3Phillips, J.M., Coltrin, M.E., Crawford, M.H., Fischer, A.J., Krames, M.R., Mueller-Mach, R., Mueller, G.O., Ohno, Y., Rohwer, L.E.S., Simmons, J.A., Tsao, J.Y., Laser Photonics Rev. 1, 307 (2007).CrossRefGoogle Scholar
4Bernardini, F., Fiorentini, V., Phys. Rev. B 56, R10024 (1997).CrossRefGoogle Scholar
5Waltereit, P., Brandt, O., Trampert, A., Grahn, H.T., Menniger, J., Ramsteiner, M., Reiche, M., Ploog, K.H., Nature 406, 865 (2000).CrossRefGoogle Scholar
6Paskova, T., Phys. Status Solidi B 245, 1011 (2008).CrossRefGoogle Scholar
7Yamada, H., Iso, K., Saito, M., Hirasawa, H., Fellows, N., Masui, H., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Phys. Status Solidi (RRL) 2, 89 (2008).CrossRefGoogle Scholar
8Waltereit, P., Brandt, O., Ramsteiner, M., Trampert, A., Grahn, H.T., Menniger, J., Reiche, M., Uecker, R., Reiche, P., Ploog, K.H., Phys. Status Solidi A 180, 133 (2000).3.0.CO;2-A>CrossRefGoogle Scholar
9Craven, M., Lim, S.H., Wu, F., Speck, J.S., DenBaars, S.P., Appl. Phys. Lett. 81, 1201 (2002).CrossRefGoogle Scholar
10Chintis, A., Chen, C., Adivarahan, V., Shatalov, M., Kuoksis, E., Mandavill, V., Yang, J., Khan, M.A., Appl. Phys. Lett. 84, 3663 (2004).Google Scholar
11Chakraborty, A., Haskell, B.A., Keller, S., Speck, J.S., DenBaars, S.P., Nakamura, S., Mishra, U.K., Appl. Phys. Lett. 85, 5143 (2004).CrossRefGoogle Scholar
12Gardner, N.F., Kim, J.C., Wierer, J.J., Shen, Y.C., Krames, M.R., Appl. Phys. Lett. 86, 111101 (2005).CrossRefGoogle Scholar
13Chakraborty, A., Haskell, B.A., Keller, S., Speck, J.S., DenBaars, S.P., Nakamura, S., Mishra, U.K., Jpn. J. Appl. Phys. 44, L173 (2005).CrossRefGoogle Scholar
14Teisseyre, H., Skierbiszewski, C., Lucznik, B., Kamler, G., Feduniewicz, A., Siekacz, M., Suski, T., Perlin, P., Grzegory, I., Porowski, S., Appl. Phys. Lett. 86, 162112 (2005).CrossRefGoogle Scholar
15Paskova, T., Kroeger, R., Figge, S., Hommel, D., Darakchieva, V., Monemar, B., Preble, E., Hanser, A., Williams, N.M., Tutor, M., Appl. Phys. Lett. 89, 051914 (2006).CrossRefGoogle Scholar
16Dwilinski, R., Doradzinski, R., Garczynski, J., Sierzputowski, L.P., Puchalski, A., Rudzinski, M., Zajac, M., in Proc. Int. Workshop on Nitride Semiconductors (2008) p. 43.Google Scholar
17Fujito, K., Kiyomi, K., Mochizuki, T., Namita, H., Nagao, S., Fujimura, I., Phys. Status Solidi A 205, 1056 (2008).CrossRefGoogle Scholar
18Okamoto, K., Ohta, H., Nakagawa, D., Sonobe, M., Ichihara, J., Takasu, H., Jpn. J. Appl. Phys. 45, L1197 (2006).CrossRefGoogle Scholar
19Schmidt, M.C., Kim, K.C., Sato, H., Fellows, N., Masui, H., Nakamura, S., DenBaars, S., Speck, J.S., Jpn. J. Appl. Phys. 46, L126 (2007).CrossRefGoogle Scholar
20Kim, K.C., Schmidt, M.C., Sato, H., Wu, F., Fellows, N., Saito, M., Fujito, K., Speck, J.S., Nakamura, S., DenBaars, S.P., Phys. Status Solidi (RRL) 1, 125 (2007).CrossRefGoogle Scholar
21Kim, K.C., Schmidt, M.C., Sato, H., Wu, F., Fellows, N., Jia, Z., Saito, M., Nakamura, S., DenBaars, S.P., Speck, J.S., Appl. Phys. Lett. 91, 181120 (2007).CrossRefGoogle Scholar
22Shen, Y.C., Mueller, G.O., Watanabe, S., Gardner, N.F., Munkholm, A., Krames, M.R., Appl. Phys. Lett. 91, 141101 (2007).CrossRefGoogle Scholar
23Sabathil, M., Laubsch, A., Strassburg, M., Lugauer, H., Peter, M., Linder, N., Lutgen, S., Hader, J., Moloney, J.V., Pasenow, B., Koch, S.W., in Proc. Int. Workshop on Nitride Semiconductors (2008) p. 269.Google Scholar
24Kim, M.H., Schubert, M.F., Dai, Q., Kim, J.K., Schubert, E.F., Piprek, J., Park, Y., Appl. Phys. Lett. 91, 183507 (2007).CrossRefGoogle Scholar
25Xie, J., Ni, X., Fan, Q., Shimada, R., Ozgur, U., Morkoc, H., Appl. Phys. Lett. 93, 183507 (2008).Google Scholar
26Yamada, H., Iso, K., Saito, M., Masui, H., Fujito, K., DenBaars, S.P., Nakamura, S., Appl. Phys. Express 1, 041101 (2008).CrossRefGoogle Scholar
27Iso, K., Yamada, H., Hirasawa, H., Fellows, N., Saito, M., Fujito, K., DenBaars, S.P., Speck, J.S., Nakamura, S., Jpn. J. Appl. Phys. 46, L960 (2007).CrossRefGoogle Scholar
28Hirai, A., Jia, Z., Schmidt, M.C., Farrell, R.M., DenBaars, S.P., Nakamura, S., Speck, J.S., Appl. Phys. Lett. 91, 191906 (2007).CrossRefGoogle Scholar
29Yamada, H., Iso, K., Saito, M., Fujito, K., DenBaars, S.P., Speck, J.S., Nakamura, S., Jpn. J. Appl. Phys. 46, L1117 (2007).CrossRefGoogle Scholar
30Tsujimura, H., Nakagawa, S., Okamoto, K., Ohta, H., Jpn. J. Appl. Phys. 46, L1010 (2007).CrossRefGoogle Scholar
31Masui, H., Yamada, H., Iso, K., Hirasawa, H., Fellows, N.N., Speck, J.S., Nakamura, S., DenBaars, S.P., Phys. Status Solidi A 205, 1203 (2008).CrossRefGoogle Scholar
32Masui, H., Yamada, H., Iso, K., Nakamura, S., DenBaars, S.P., J. Phys. D: Appl. Phys. 41, 225104 (2008).CrossRefGoogle Scholar
33Park, S.H., Ahn, D., Chuang, S.L., IEEE J. Quantum Electron. 43, 1175 (2007).CrossRefGoogle Scholar
34Nakagawa, S., Tsujimura, H., Okamoto, K., Kubota, M., Ohta, H., Appl. Phys. Lett. 91, 171110 (2007).CrossRefGoogle Scholar
35Romanov, A.E., Baker, T.J., Nakamura, S., Speck, J.S., J. Appl. Phys. 100, 023522 (2006).CrossRefGoogle Scholar
36Park, S.H., Ahn, D., Appl. Phys. Lett. 90, 013505 (2007).CrossRefGoogle Scholar
37Kamiyama, S., Honshio, A., Kitano, T., Iwaya, M., Amano, H., Akasaki, I., Kinoshita, H., Shiomi, H., Phys. Status Solidi C 2, 2121 (2005).CrossRefGoogle Scholar
38Chakraborty, A., Baker, T.J., Haskell, B.A., Wu, F., Speck, J.S., DenBaars, S.P., Nakamura, S., Mishra, U.K., Jpn. J. Appl. Phys. 44, L945 (2005).CrossRefGoogle Scholar
39Sharma, R., Pattison, P.M., Masui, H., Farrell, R.M., Baker, T.J., Haskell, B.A., Wu, F., DenBaars, S.P., Speck, J.S., Nakamura, S., Appl. Phys. Lett. 87, 231110 (2005).CrossRefGoogle Scholar
40Funato, M., Ueda, M., Kawakami, Y., Narukawa, Y., Kosugi, T., Takahashi, M., Mukai, T., Jpn. J. Appl. Phys. 45, L659 (2006).CrossRefGoogle Scholar
41Tyagi, A., Zhong, H., Fellows, N., Iza, M., Speck, J.S., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 46, L129 (2007).CrossRefGoogle Scholar
42Zhong, H., Tyagi, A., Fellows, N., Wu, F., Chung, R.B., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Appl. Phys. Lett. 90, 233504 (2007).CrossRefGoogle Scholar
43Zhong, H., Tyagi, A., Fellows, N.N., Chung, R.B., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Electron. Lett. 43, 825 (2007).CrossRefGoogle Scholar
44Sato, H., Tyagi, A., Zhong, H., Fellows, N., Chung, R.B., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Phys. Status Solidi (RRL) 1, 162 (2007).CrossRefGoogle Scholar
45Sato, H., Chung, R.B., Hirohiko, H., Fellows, N., Masui, H., Wu, F., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Appl. Phys. Lett. 92, 221110 (2008).CrossRefGoogle Scholar
46Fellows, N., Sato, H., Masui, H., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 47, 7854 (2008).CrossRefGoogle Scholar
47Ueda, M., Funato, M., Kojima, K., Kawakami, Y., Narukawa, Y., Mukai, T., Phys. Rev. B 78, 233303 (2008).CrossRefGoogle Scholar
48Fellows, N., Sato, H., Lin, Y., Chung, R.B., DenBaars, S.P., Nakamura, S., Appl. Phys. Lett. 93, 121112 (2008).CrossRefGoogle Scholar