Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract

Metadislocations in Complex Metallic Alloys

Sub-nanometer Resolution Chemi-STEM EDS Mapping of Superlattice Intrinsic Stacking Faults in Co-based Superalloys

Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations

STEM-Based Characterization of Dislocations and Stacking Faults in Structural Materials

Polar Oxide Interface Characterization by Differential Phase Contrast STEM

Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell

Chemical and Defect Analysis in a ZrO2/LSMO Pillar-Matrix System

Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Local Strain Measurements at Dislocations, Disclinations and Domain Boundaries

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

Direct Lattice Parameter Measurements Using HAADF-STEM

Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging

Column-by-Column Imaging of Dislocation Slip Processes in CdTe

Statistical Characterization of High Angle Graphene Grain Boundaries at Atomic Resolution

Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM

Experimental Evidence of Chiral Gold Nanowires with Boerdijk-Coxeter-Bernal Structure by Atomic-Resolution Imaging

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract