Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Advances in Cathodoluminescence and Soft X-ray Microanalysis

Abstract

Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables

Zircon Metamictisation study by Cathodoluminescence and X-ray Imaging

Cathodoluminescence Microanalysis of Amorphised Quartz

Novel Cathodoluminescence Detector with Extremely Large Field of View

Quartz Overgrowths in Shales and Sandstones studied by EPMA and SIMS

Luminescence database - an update

The Present State of Chemical State Analysis in EPMA and WD-SXES

Cathodoluminescence and DART Mass Spectrometry for the Forensic Identification of Explosive and Narcotic Particle Residues on Surfaces

Cs-Correctors: Current State and Ongoing Developments

Abstract

Lifetime of Optical States in Transmission Electron Microscopy

Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Overview of Commercially Available CEOS Hexapole-type Aberration Correctors

Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series

Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM

A Need for Bandwidth Limitations in Electron Microscopes

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Advances in Cathodoluminescence and Soft X-ray Microanalysis

Abstract

Cs-Correctors: Current State and Ongoing Developments

Abstract