Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Cs-Correctors: Current State and Ongoing Developments

Abstract

Aberration-Corrected STEM by Means of Diffraction Gratings

Circumventing Scherzer's Theorem: Large Numerical Aperture Objective Lenses for Pulsed Electron Microscopy

The Real Structure of Cu3Ni2SbO6 and Cu3Co2SbO6 Delafossites with Honeycomb Lattices by Aberration-Corrected HRTEM

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

Characterization of Photovoltaics: From Cells Properties to Atoms

Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel With Use of Complementary Atom Probe Tomography and Electron Microscopy

3D Microstructure Characterization and Analysis of Al-Si Foundry Alloys at Different Length Scales

Probing the Crystallography of Ordered Phases by coupling Orientation Microscopy and Atom Probe Tomography

Investigation of Possible Nucleation Mechanisms for Producing an Ultra-Refined Alpha Phase Microstructure in Beta Titanium Alloys Using High-Resolution Electron Microscopy and 3D Atom Probe Tomography

From Micro to Nano: Correlative 3D Microscopies for Analysis of Biointerfaces

Investigating the Effects of a Heat Treatment on Microstructure of an Ultrahigh Carbon Steel through SEM and In Situ CLSM studies

SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics

In-situ EM Characterization of Li-ion Battery through Multiple Cycles

Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology

The Atmospheric Scanning Electron Microscope (ASEM) Observes Axonal Segmentation and Synaptic Induction in Solution

Correlative Imaging and Cryo-FIB Processing for Direct Visualization of HIV-1 Infection

Correlating Multiscale Measurements of Nanoparticles in Primary Cells

Observation of Tissues in Solution by Atmospheric Scanning Electron Microscope (ASEM)

The Strategy of Advanced Analysis in Semiconductor Nano-Device: From Nanoprobing to Nanoscopy and Nanoanalysis

Multi-scale EBSD and EDS for Detection and Analysis of Spatially Rare Grains and Phases

A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Cs-Correctors: Current State and Ongoing Developments

Abstract

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract