Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract

Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs

Accuracy of Strain in Strain Maps Improved by Averaging Multiple Maps

Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD)

Measurement of Local Atomic Displacements Reveals Interaction of Au Nanocrystals with Rutile (TiO2) Surface Steps

Atomic Resolution Study of Local Strains in Doped VO2 Nanowires

Strain Associated with Surface-Penetrating Dislocations Visible by Electron Channeling Contrast Imaging

Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for the Gatan DigitalMicrograph Platform

Investigation of Bi Segregation of Cu Bicrystal Boundaries Using Aberration-Corrected STEM Depth Sectioning

Observations on Heavily Deformed Tantalum

Atomic-scale Observation of Grains and Grain Boundaries in Monolayers of WS2

Imaging Defects in Quantum Materials

An Electron Microscopic Investigation of (1/3) < 0ī11 > Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects.

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

Applications and Design of Reinforced Silicon Nitride Windows for In Situ Liquid Transmission Electron Microscopy

TAG Lens: Revolutionizing Optical Microscopy With Ultra-High Speed Variable Focus

A Novel Compact Stand-alone FTIR Microscope for the Analysis of Small Samples

Rapid, High-Resolution Raman Imaging of Pharmaceutical, Biological, and Other Materials with the Thermo Scientific DXRxi.

The Unique Capabilities of Auger Electron Spectroscopy

Secondary Electron Imaging in the Helium Ion Microscope

Optimized Electron Column and Detection Scheme for Advanced Imaging and Analysis of Metals

New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract