Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
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Volume 17 - Supplement S2 - July 2011

Contents

Page 17 of 49

Instrumentation and Techniques

Focused Ion Beam

Abstract

On-Probe Thinning of Samples for Bulk or STEM Type EDS Analysis
C Hartfield, B Miller
Published online by Cambridge University Press:

08 April 2017, pp. 642-643
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Cryo-FIB Machining: An Alternative to TEM Cryo-Sections Cut with Diamonds?
M Hayles, M de Winter, C Schneijdenberg, J Meeldijk, H Persoon, U Luecken, A Verkleij, B Humbel
Published online by Cambridge University Press:

08 April 2017, pp. 644-645
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

TEM Specimen Preparation with Plasma FIB Xe+ Ions
L Giannuzzi, N Smith
Published online by Cambridge University Press:

09 April 2017, pp. 646-647
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Large Volume High Resolution FIB Nanotomography
J Huang
Published online by Cambridge University Press:

08 April 2017, pp. 648-649
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Hyperion Plasma FIB for Precision 3D TSV Analysis
N Smith, P Tesch, N Martin, R Boswell
Published online by Cambridge University Press:

08 April 2017, pp. 650-651
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications
R Young, C Rue, S Randolph, C Chandler, G Franz, R Schampers, A Klumpp, L Kwakman
Published online by Cambridge University Press:

08 April 2017, pp. 652-653
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

An Aberration Corrected FIB for Nano-Area Mass Spectrometry
S Itose, M Matsuya, S Uno, K Yamashita, S Ebata, M Ishihara, K Uchino, H Yurimoto, K Sakaguchi, M Kudo
Published online by Cambridge University Press:

08 April 2017, pp. 654-655
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Direct Imaging of Microstructural Changes in Si Induced by FIB-Patterning with Si++ and Ga+ Ions
S Chee, M Kammler, J Graham, F Ross, R Hull
Published online by Cambridge University Press:

08 April 2017, pp. 656-657
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling
H Stegmann, H Dömer, R Rosenkranz, E Zschech
Published online by Cambridge University Press:

08 April 2017, pp. 658-659
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Contrast Performance: Low Voltage Electrons vs. Helium Ions
D Bell
Published online by Cambridge University Press:

08 April 2017, pp. 660-661
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells
C Xiao, R Minqin, C Ce-Belle, C Udalagama, A Bettiol, F Ee, L Yue, F Watt
Published online by Cambridge University Press:

08 April 2017, pp. 662-663
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A Closer Look at the Brain in 3D Using FIB-SEM
C Xu, H Hess
Published online by Cambridge University Press:

08 April 2017, pp. 664-665
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Serial Sectioning in SEM: Challenges and Opportunities
A Avishai, N Avishai, G Kidd, K Olszens, D McDonald, S Duarte, D Mustafi, K Palczewski, S Frase, A Heuer
Published online by Cambridge University Press:

08 April 2017, pp. 666-667
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Application of Cryo FIB SEM for Nano-EHS Studies
K Scott
Published online by Cambridge University Press:

08 April 2017, pp. 668-669
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Characterizing the Microstructure of Corrosion Films Formed on Zircaloy-4 Using Focused Ion Beam (FIB) Serial Sectioning and 3-D Reconstruction
G Lucadamo, R Bajaj, K Anderson, S Claves, J Gruber
Published online by Cambridge University Press:

08 April 2017, pp. 670-671
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future
R Livengood, S Tan, P Hack, M Kane, Y Greenzweig
Published online by Cambridge University Press:

08 April 2017, pp. 672-673
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Experimental Observations on FIB Milling using a Custom Software Interface
N Caldwell, J Poole, B Breton, D Holburn
Published online by Cambridge University Press:

08 April 2017, pp. 674-675
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Aspects of Beam Control for Single and Dual Beam Systems
K Lagarec, A Laquerre, M Phaneuf
Published online by Cambridge University Press:

09 April 2017, pp. 676-677
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Site Specific Focused Ion Beam (FIB) Sample Preparation of Penetrative Oxidation in Ni-Base Alloys for 3DAPT Analysis
M Olszta, L Thomas, S Bruemmer
Published online by Cambridge University Press:

08 April 2017, pp. 678-679
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

The Effect of Crystallinity on Materials Removal Rate of Polyolefins During Ga+ Focused Ion Beam Nanomachining
K Wong, A Batchelor, C Balik, D Griffis
Published online by Cambridge University Press:

09 April 2017, pp. 680-681
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 17 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Focused Ion Beam

Abstract

On-Probe Thinning of Samples for Bulk or STEM Type EDS Analysis

Cryo-FIB Machining: An Alternative to TEM Cryo-Sections Cut with Diamonds?

TEM Specimen Preparation with Plasma FIB Xe+ Ions

Large Volume High Resolution FIB Nanotomography

Hyperion Plasma FIB for Precision 3D TSV Analysis

A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications

An Aberration Corrected FIB for Nano-Area Mass Spectrometry

Direct Imaging of Microstructural Changes in Si Induced by FIB-Patterning with Si++ and Ga+ Ions

Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling

Contrast Performance: Low Voltage Electrons vs. Helium Ions

MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells

A Closer Look at the Brain in 3D Using FIB-SEM

Serial Sectioning in SEM: Challenges and Opportunities

Application of Cryo FIB SEM for Nano-EHS Studies

Characterizing the Microstructure of Corrosion Films Formed on Zircaloy-4 Using Focused Ion Beam (FIB) Serial Sectioning and 3-D Reconstruction

Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future

Experimental Observations on FIB Milling using a Custom Software Interface

Aspects of Beam Control for Single and Dual Beam Systems

Site Specific Focused Ion Beam (FIB) Sample Preparation of Penetrative Oxidation in Ni-Base Alloys for 3DAPT Analysis

The Effect of Crystallinity on Materials Removal Rate of Polyolefins During Ga+ Focused Ion Beam Nanomachining

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Focused Ion Beam

Abstract