Application of Cryo FIB SEM for Nano-EHS Studies

K Scott

doi:10.1017/S1431927611004211

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Application of Cryo FIB SEM for Nano-EHS Studies

Published online by Cambridge University Press: 08 April 2017

K Scott

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K Scott*: Affiliation:
National Institute of Standards and Technology

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 668 - 669

DOI: https://doi.org/10.1017/S1431927611004211 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2011

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Application of Cryo FIB SEM for Nano-EHS Studies

Volume 17, Supplement S2
K Scott ^(a1)
DOI: https://doi.org/10.1017/S1431927611004211

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Application of Cryo FIB SEM for Nano-EHS Studies

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