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Volume 17 - Supplement S2 - July 2011

Contents

Page 20 of 49

Instrumentation and Techniques

Advances in EELS and EFTEM

Abstract

  • EELS and EFTEM of Surface Plasmons in Metallic Nanostructures

  • W Sigle, L Gu, N Talebi, B Ögüt, C Koch, R Vogelgesang, P van Aken
  • Published online by Cambridge University Press:
    08 April 2017, pp. 762-763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Mapping of Electron-Beam-Excited Plasmon Modes in Lithographically-Defined Gold Nanostructures

  • A Koh, A Fernandez-Dominguez, S Maier, J Yang, D McComb
  • Published online by Cambridge University Press:
    09 April 2017, pp. 764-765
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Fabry-Perot Plasmonic Resonances in Silver Nanowire Antennas Imaged with a Sub-Nanometer Electron Probe

  • D Rossouw, M Couillard, J Vickery, E Kumacheva, G Botton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 766-767
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Low-Loss Studies on Metallic and Insulating Nanostructures Using a Monochromatic Electron Beam

  • R Arenal
  • Published online by Cambridge University Press:
    08 April 2017, pp. 768-769
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Simulation of valence EELS and Optical Response Functions from First Principles

  • V Keast, R Burgess, D Walton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 772-773
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Extrapolating the Valence Spectral Limit in EELS

  • J Aguiar, Q Ramasse, B Reed, N Browning
  • Published online by Cambridge University Press:
    08 April 2017, pp. 774-775
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • EELS Studies of Extrinsic Multiferroics

  • B Warot-Fonrose, E Snoeck, G Delaizir, P Rozier, M Dollé, V Serin, J Bobo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 776-777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Energy Loss Spectroscopy for Aqueous in Situ Scanning Transmission Electron Microscopy

  • K Jungjohann, J Evans, I Arslan, N Browning
  • Published online by Cambridge University Press:
    08 April 2017, pp. 778-779
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Energy-Loss Characteristics for EFTEM Imaging with a Liquid Flow Cell

  • K Klein, N de Jonge, I Anderson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 780-781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Analysis and Artifacts in EELS Spectrum Imaging

  • J Mundy, L Fitting Kourkoutis, H Xin, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 782-783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Multivariate Statistical Analysis Strategies of EELS Spectral Images

  • M Van Benthem, P Kotula, P Lu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 784-785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Applications of Atomic-Resolution EELS Mapping at Low kV

  • B Schaffer, F Azough, D Abou-Ras, S Schmidt, M Schaffer, M Sarahan, Q Ramasse, R Caballero
  • Published online by Cambridge University Press:
    08 April 2017, pp. 786-787
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • HAADF and EELS Combined Studies of a New Generation of Materials for Ni-MH Batteries

  • V Serin, C Magen, R Serra, M Ibarra, M Hÿtch, J Zhang, L Lemort, M Latroche, B Knosp, P Bernard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 788-789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification

  • M Watanabe, F Allen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 790-791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Cornell Spectrum Imager: Open Source Spectrum Analysis with ImageJ

  • P Cueva, R Hovden, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 792-793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-Situ Study of Nb Oxide Thin Films Using Electron Energy Loss Spectroscopy

  • R Tao, R Klie, A Romanenko, L Cooley
  • Published online by Cambridge University Press:
    08 April 2017, pp. 798-799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Energy Loss Near-Edge Fine Structure of Oxygen K of Spinel NixMn3-xO4

  • J Li, S Ko, S Trolier-McKinstry, E Dickey
  • Published online by Cambridge University Press:
    09 April 2017, pp. 800-801
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 20 of 49