Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
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Volume 17 - Supplement S2 - July 2011

Contents

Page 19 of 49

Instrumentation and Techniques

Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

A Lattice-Rectified and Detection Efficiency Compensated APT Reconstruction
M Moody, A Ceguerra, A Breen, B Gault, L Stephenson, R Marceau, S Ringer
Published online by Cambridge University Press:

08 April 2017, pp. 722-723
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Toward Automated Optimization of Reconstruction of Atom Probe Data
D Larson, B Geiser, T Prosa, T Kelly
Published online by Cambridge University Press:

08 April 2017, pp. 724-725
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Estimation of Specimen Lensing in Atom Probe Tomography
D Haley, G Smith, C Grovenor
Published online by Cambridge University Press:

08 April 2017, pp. 726-727
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Analytic Hitmap Equation of the Ideal Spherical Evaporator
B Geiser, E Oltman, D Larson, T Prosa, T Kelly
Published online by Cambridge University Press:

08 April 2017, pp. 728-729
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Importance of the Protective Layers and the Specimen Preparation for Reproducible APT Results
S Mutas, C Klein
Published online by Cambridge University Press:

08 April 2017, pp. 730-731
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Application of Atom Probe Tomography in Understanding Thin Film Chemical Ordering and Stress Behavior
G Thompson, B Fu, D Means, B Wang
Published online by Cambridge University Press:

08 April 2017, pp. 732-733
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Resolving Nanostructures in Complex Penetrative Oxidation for Ni-30Cr Alloys Exposed to High-Temperature Water using APT and TEM
M Olszta, L Thomas, S Bruemmer
Published online by Cambridge University Press:

08 April 2017, pp. 734-735
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Transmission Electron Microscopy and Atom Probe Tomography Analysis of Rare-Earth Hexaboride Nanowires
D Diercks, C Cheung, J Brewer
Published online by Cambridge University Press:

08 April 2017, pp. 736-737
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography
S Kuchibhatla, V Shutthanandan, B Arey, T Prosa, P Adusumilli, R Ulfig, C Wang, S Thevuthaasan
Published online by Cambridge University Press:

09 April 2017, pp. 738-739
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data
D Larson, B Geiser, T Prosa, R Ulfig, T Kelly
Published online by Cambridge University Press:

08 April 2017, pp. 740-741
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Analysis of Laser Influence on Field Enhancement and Heating of the Specimen in Pulsed Laser Atom Probe Tomography
X Chen, C Tourek, X Wang, S Sundararajan
Published online by Cambridge University Press:

08 April 2017, pp. 742-743
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Analysis of Ion Evaporation Events through Data Mining: an Experimental Foundation for Interpreting Chemical Imaging in the Atomscope
S Broderick, K Kaluskar, M Miller, S Ringer, T Kelly, K Rajan
Published online by Cambridge University Press:

08 April 2017, pp. 744-745
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Kinetic-Energy Discrimination for Atom Probe Tomography: Concepts and Potential Detectors
T Kelly
Published online by Cambridge University Press:

08 April 2017, pp. 746-747
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Characterization of the Chemistry and Structure of Material Transfer on AFM Tips Resulting from Contact and Sliding Experiments
C Tourek, S Sundararajan
Published online by Cambridge University Press:

08 April 2017, pp. 748-749
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield
T Prosa, D Lawrence, D Olson, D Lenz, J Bunton, D Larson
Published online by Cambridge University Press:

08 April 2017, pp. 750-751
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
D Larson, D Lawrence, D Olson, T Prosa, D Reinhard, R Ulfig, P Clifton, J Bunton, D Lenz, J Olson, L Renaud, I Martin, T Kelly
Published online by Cambridge University Press:

08 April 2017, pp. 752-753
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

MeasuringContributions to Mass Resolving Power in Atom Probe Tomography
E Oltman, T Kelly, T Prosa, D Lawrence, D Larson
Published online by Cambridge University Press:

08 April 2017, pp. 754-755
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging
P Felfer, J Cairney
Published online by Cambridge University Press:

08 April 2017, pp. 756-757
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

TEM and Atom Probe Investigation of Calcium Carbonate Precipitation in Seawater
S McMurray, B Gorman, D Diercks
Published online by Cambridge University Press:

08 April 2017, pp. 758-759
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
S Kuchibhatla, V Shutthanandan, B Arey, L Kovarik, C Wang, T Prosa, R Ulfig, S Thevuthasan, B Gorman
Published online by Cambridge University Press:

08 April 2017, pp. 760-761
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 19 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

A Lattice-Rectified and Detection Efficiency Compensated APT Reconstruction

Toward Automated Optimization of Reconstruction of Atom Probe Data

Estimation of Specimen Lensing in Atom Probe Tomography

Analytic Hitmap Equation of the Ideal Spherical Evaporator

Importance of the Protective Layers and the Specimen Preparation for Reproducible APT Results

Application of Atom Probe Tomography in Understanding Thin Film Chemical Ordering and Stress Behavior

Resolving Nanostructures in Complex Penetrative Oxidation for Ni-30Cr Alloys Exposed to High-Temperature Water using APT and TEM

Transmission Electron Microscopy and Atom Probe Tomography Analysis of Rare-Earth Hexaboride Nanowires

Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography

Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data

Analysis of Laser Influence on Field Enhancement and Heating of the Specimen in Pulsed Laser Atom Probe Tomography

Analysis of Ion Evaporation Events through Data Mining: an Experimental Foundation for Interpreting Chemical Imaging in the Atomscope

Kinetic-Energy Discrimination for Atom Probe Tomography: Concepts and Potential Detectors

Characterization of the Chemistry and Structure of Material Transfer on AFM Tips Resulting from Contact and Sliding Experiments

Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield

Prospects for Atom Probe Tomography of Commercial Semiconductor Devices

MeasuringContributions to Mass Resolving Power in Atom Probe Tomography

New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging

TEM and Atom Probe Investigation of Calcium Carbonate Precipitation in Seawater

Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract