Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 17 - Supplement S2 - July 2011

Contents

Page 16 of 49

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Quantification of Grain Boundary Segregation Monolayers by X-ray Spectroscopy in a Scanning Electron Microscope
P Nowakowski, F Christien, M Allart, Y Borjon-Piron, R Le Gall, J Ménard, H Mantz
Published online by Cambridge University Press:

08 April 2017, pp. 602-603
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer
M Terauchi, H Takahashi, N Handa, T Murano, M Koike, T Kawachi, T Imazono, N Hasagawa, M Koeda, T Nagano, H Sasai, Y Oue, Z Yonezawa, S Kuramoto
Published online by Cambridge University Press:

08 April 2017, pp. 604-605
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

X-ray Microanalysis Artifacts Visualized
V Dusevich, J Melander, J Eick
Published online by Cambridge University Press:

09 April 2017, pp. 606-607
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles
C Schwandt
Published online by Cambridge University Press:

08 April 2017, pp. 608-609
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

High Current Electron-probe Microanalysis of Ni and Co in Olivine in the NWA 773 Lunar Meteorite Clan
K Gibson, B Jolliff, P Carpenter
Published online by Cambridge University Press:

08 April 2017, pp. 610-611
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software
H Demers, N Poirier-Demers, N de Jonge, D Drouin
Published online by Cambridge University Press:

08 April 2017, pp. 612-613
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Instrumental Performance Parameters for Specification and Check of Energy Dispersive X-Ray Spectrometers as in the International Standard ISO 15632
V-D Hodoroaba
Published online by Cambridge University Press:

08 April 2017, pp. 614-615
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Industrial Applications of Electron Probe Microanalysis (EPMA)
S Goresh
Published online by Cambridge University Press:

08 April 2017, pp. 616-617
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Environmental NanoBiology: Structural Evaluation Of Naturally Occurring Transition Metal Oxide-Containing Surface Films From Freshwaters
R Smith, E Sánchez
Published online by Cambridge University Press:

08 April 2017, pp. 618-619
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Windowless Silicon Drift Detectors
R Anderhalt, A Sandborg
Published online by Cambridge University Press:

08 April 2017, pp. 620-621
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances In Microscopy and Microanalysis in the Field of Forensic Firearm Examination and Identification
D Lamagna
Published online by Cambridge University Press:

08 April 2017, pp. 622-623
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Improving Analytical Spatial Resolution with the JEOL Field Emission Electron Microprobe
P McSwiggen, N Mori, M Takakura, C Nielsen
Published online by Cambridge University Press:

08 April 2017, pp. 624-625
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Focused Ion Beam

Abstract

Advanced FIB Sample Preparation for High Performance TEM Analysis
F Altmann, R Salzer, M Simon, S Huebner, C Grosse, A Graff
Published online by Cambridge University Press:

08 April 2017, pp. 626-627
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas
L Lechner, J Biskupek, U Kaiser
Published online by Cambridge University Press:

08 April 2017, pp. 628-629
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Optimized FIB Sample Preparation for Atomic Resolution Analytical STEM at Low kV - A Key Requirement for Successful Application
M Schaffer, B Schaffer, Q Ramasse, M Falke, D Abou-Ras, S Schmidt, R Caballero, K Marquardt
Published online by Cambridge University Press:

08 April 2017, pp. 630-631
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review
R Cerchiara, P Fischione, J Liu, J Matesa, A Robins
Published online by Cambridge University Press:

08 April 2017, pp. 632-633
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advanced Physical Failure Analysis Techniques Using 3D Rotation Imaging from Plane-View TEM Sample
H-J Kang, J-G Gwak, T-S Park, T-S Back, H-J Kim, O Han
Published online by Cambridge University Press:

08 April 2017, pp. 634-635
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Focus Ion Beam for Cross-Sectional TEM Specimen Preparation of Nanomaterials
J-G Zheng, S Xie
Published online by Cambridge University Press:

08 April 2017, pp. 636-637
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates
F Rivera, J Abbott, R Davis, R Vanfleet
Published online by Cambridge University Press:

08 April 2017, pp. 638-639
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

In Situ Probe Approaches for Charge Reduction, Sample Manipulation, and Modified Total Release Lift-out
K Langworthy, J Ditto, C Hartfield, D Krinsley
Published online by Cambridge University Press:

08 April 2017, pp. 640-641
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 16 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Quantification of Grain Boundary Segregation Monolayers by X-ray Spectroscopy in a Scanning Electron Microscope

An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer

X-ray Microanalysis Artifacts Visualized

Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

High Current Electron-probe Microanalysis of Ni and Co in Olivine in the NWA 773 Lunar Meteorite Clan

Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software

Instrumental Performance Parameters for Specification and Check of Energy Dispersive X-Ray Spectrometers as in the International Standard ISO 15632

Industrial Applications of Electron Probe Microanalysis (EPMA)

Environmental NanoBiology: Structural Evaluation Of Naturally Occurring Transition Metal Oxide-Containing Surface Films From Freshwaters

Windowless Silicon Drift Detectors

Advances In Microscopy and Microanalysis in the Field of Forensic Firearm Examination and Identification

Improving Analytical Spatial Resolution with the JEOL Field Emission Electron Microprobe

Focused Ion Beam

Abstract

Advanced FIB Sample Preparation for High Performance TEM Analysis

FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas

Optimized FIB Sample Preparation for Atomic Resolution Analytical STEM at Low kV - A Key Requirement for Successful Application

Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

Advanced Physical Failure Analysis Techniques Using 3D Rotation Imaging from Plane-View TEM Sample

Focus Ion Beam for Cross-Sectional TEM Specimen Preparation of Nanomaterials

FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates

In Situ Probe Approaches for Charge Reduction, Sample Manipulation, and Modified Total Release Lift-out

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Focused Ion Beam

Abstract