Microscopy and Microanalysis: Volume 17 - Issue S2

Only show content I have access to (975)

Over 3 years (975)

Instrumentation and Techniques (428)

Physical Sciences (348)

Biological Sciences (192)

Tutorial (5)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

< Back to all issues

Volume 17 - Supplement S2 - July 2011

Contents

Page 15 of 49

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry
P Williams
Published online by Cambridge University Press:

08 April 2017, pp. 562-563
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Automated Classification of SIMS Images Using K-means Clustering
A Konicek, J Lefman, C Szakal
Published online by Cambridge University Press:

08 April 2017, pp. 564-565
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Trace Element Micro-Analytical Imaging via Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
A Netting, J Payne, B Wade, T Raimondo
Published online by Cambridge University Press:

09 April 2017, pp. 566-567
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Carbonaceous Materials Original to Impact Plume Condensates in a 3.24 Ga Impact-Derived Spherule Deposit, Barberton Greenstone Belt, South Africa
E Scroggs, J Friel, A Davatzes
Published online by Cambridge University Press:

08 April 2017, pp. 568-569
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Back-scattered Electron Tomography and X-Ray Microanalysis of Zirconolite in Lunar Granite 12032,366-19
S Seddio, B Jolliff, R Korotev, P Carpenter
Published online by Cambridge University Press:

08 April 2017, pp. 570-571
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Quantifying Crystallographic Information from Electron Diffraction Patterns in the TEM
J Lábár
Published online by Cambridge University Press:

09 April 2017, pp. 572-573
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Using Electron Backscatter Diffraction to Aid Identification of Fossilized Dinosaur Eggshells
P Trimby, G Grellet-Tinner
Published online by Cambridge University Press:

08 April 2017, pp. 574-575
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA
M Jercinovic, M Williams, J Allaz, J Donovan
Published online by Cambridge University Press:

08 April 2017, pp. 576-577
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Challenges in Electron Probe Micronalysis 60 Years after Castaing: Examples from Complex Uranium and Rare Earth Element Minerals from Northern Australian Ore Deposits
K Goemann
Published online by Cambridge University Press:

08 April 2017, pp. 578-579
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Improving EPMA Analyses Using Mean Atomic Number Backgrounds
D Wark, J Donovan
Published online by Cambridge University Press:

08 April 2017, pp. 580-581
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in Electron-probe Microanalysis and Problem-Solving Approaches Using Microanalysis Tools
P Carpenter
Published online by Cambridge University Press:

08 April 2017, pp. 582-583
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Historical Development of the Cameca EPMA
D Snoeyenbos, M Outrequin
Published online by Cambridge University Press:

08 April 2017, pp. 584-585
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

50 Years of JEOL Electron Probe Micro Analyzer
H Takahashi
Published online by Cambridge University Press:

09 April 2017, pp. 586-587
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Beam Sensitivity in EPMA: The Analysis of Apatite, Ca5(PO4)3(F,Cl,OH)
C Henderson
Published online by Cambridge University Press:

08 April 2017, pp. 588-589
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

On the Performance of XEDS and EELS in the AEM: 25 Years Later
H Fraser, D Klenov, Y-C Wang, H Cheng, N Zaluzec
Published online by Cambridge University Press:

08 April 2017, pp. 590-591
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials
D Meier, J Davis, A Konicek, E Vicenzi, S Wight
Published online by Cambridge University Press:

08 April 2017, pp. 592-593
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Multivariate Statistical Analysis of STEM-EDS at the Noise Floor
C Parish, P Edmondson, M Miller
Published online by Cambridge University Press:

08 April 2017, pp. 594-595
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

High Resolution Imaging and X-Ray Microanalysis in the FE-SEM
R Gauvin, N Brodusch, P Michaud, L Rodrigue, M Trudeau
Published online by Cambridge University Press:

08 April 2017, pp. 596-597
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy
D Klenov, B Freitag, H von Harrach, A D'Alfonso, L Allen
Published online by Cambridge University Press:

08 April 2017, pp. 598-599
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM
V-D Hodoroaba, T Salge, R Terborg, V Rackwitz
Published online by Cambridge University Press:

08 April 2017, pp. 600-601
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 15 of 49

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry

Automated Classification of SIMS Images Using K-means Clustering

Trace Element Micro-Analytical Imaging via Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)

Carbonaceous Materials Original to Impact Plume Condensates in a 3.24 Ga Impact-Derived Spherule Deposit, Barberton Greenstone Belt, South Africa

Back-scattered Electron Tomography and X-Ray Microanalysis of Zirconolite in Lunar Granite 12032,366-19

Quantifying Crystallographic Information from Electron Diffraction Patterns in the TEM

Using Electron Backscatter Diffraction to Aid Identification of Fossilized Dinosaur Eggshells

Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA

Challenges in Electron Probe Micronalysis 60 Years after Castaing: Examples from Complex Uranium and Rare Earth Element Minerals from Northern Australian Ore Deposits

Improving EPMA Analyses Using Mean Atomic Number Backgrounds

Advances in Electron-probe Microanalysis and Problem-Solving Approaches Using Microanalysis Tools

Historical Development of the Cameca EPMA

50 Years of JEOL Electron Probe Micro Analyzer

Beam Sensitivity in EPMA: The Analysis of Apatite, Ca5(PO4)3(F,Cl,OH)

On the Performance of XEDS and EELS in the AEM: 25 Years Later

X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

Multivariate Statistical Analysis of STEM-EDS at the Noise Floor

High Resolution Imaging and X-Ray Microanalysis in the FE-SEM

Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract