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X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

Published online by Cambridge University Press:  08 April 2017

D Meier ,
J Davis ,
A Konicek ,
E Vicenzi  and
S Wight
D Meier
Affiliation:
National Institute of Standards and Technology
J Davis
Affiliation:
National Institute of Standards and Technology
A Konicek
Affiliation:
National Institute of Standards and Technology
E Vicenzi
Affiliation:
Smithsonian Institution
S Wight
Affiliation:
National Institute of Standards and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 592 - 593
Copyright
Copyright © Microscopy Society of America 2011