Instrumentation and Techniques
Focused Ion Beam
Abstract
Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 682-683
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The Focused Ion Beam Hard Mask Mechanism
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 684-685
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New Generalized Method for the TEM Examination of Buried Interfaces with Application to the Copper Bond Wire - Aluminum Pad System
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- 08 April 2017, pp. 686-687
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Development of a Cryo-Air Protection Holder for FIB/(S)TEM
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- 08 April 2017, pp. 688-689
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A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique
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- 08 April 2017, pp. 690-691
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Three Dimensional Characterization of Cells in Hydrogel with Focused Ion Beam
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- 08 April 2017, pp. 692-693
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Preparation of 2-D Sections of Li-ion Battery Electrode Architectures with a Focused Ion Beam and Modeling
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- 08 April 2017, pp. 694-695
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FIB TEM Sample Preparation of Deeply Buried Interfaces
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- 08 April 2017, pp. 696-697
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Effect of Ion Currents on the Morphology of Focused Ion Beam Milled Patterns on a Single Crystalline Diamond
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- 09 April 2017, pp. 698-699
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The Study of the FIB Induced Damage in Diamond
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- 08 April 2017, pp. 700-701
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Significance of Outer Keratin Cortices to Structural Color Production in Feathers Revealed through Focused Ion Beam Milling and Microspectrometry
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- 08 April 2017, pp. 702-703
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Effect of an Electric Field within Microscope Monohaz FIB between a Micro Manipulator Sharp and the Ion Trap of the Electron Detector
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- 08 April 2017, pp. 704-705
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Advancing Data Collection and Analysis for Atom Probe Tomography
Abstract
Metrics for Characterization of Atom Probe Instrument Performance
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 706-707
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Toward Atomic-Scale Tomography: The ATOM Project
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- 08 April 2017, pp. 708-709
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Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction
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- 09 April 2017, pp. 710-711
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First Principles Modeling Studies of Field Evaporation:Preliminary Studies Relevant to the Atomscope
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- 08 April 2017, pp. 712-713
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Improved Yield and Data Quality in Atom Probe Tomography
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- 08 April 2017, pp. 714-715
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Atom Probe Tomography of Engineered Nanostructures with Complex Field Evaporation Behavior
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- 08 April 2017, pp. 716-717
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Atom Probe Tomography of Interfaces at the Near-Lattice Level
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- 08 April 2017, pp. 718-719
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Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- 08 April 2017, pp. 720-721
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