Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 17 - Supplement S2 - July 2011

Contents

Page 22 of 49

Instrumentation and Techniques

Microanalysis Standards

Abstract

An Investigation of “San Carlos Olivine”: Comparing USNM-distributed Material with Commercially Available Material
J Fournelle
Published online by Cambridge University Press:

08 April 2017, pp. 842-843
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microanalysis Standards and Instrumental Calibration: Practical Improvements in Analytical Confidence
P Carpenter
Published online by Cambridge University Press:

08 April 2017, pp. 844-845
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

The Status of the Smithsonian Microbeam Standards
T Rose
Published online by Cambridge University Press:

09 April 2017, pp. 846-847
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A U.S. Geological Survey Round Robin for Microanalytical Techniques
H Lowers, A Koenig, S Wilson, D Adams, G Meeker
Published online by Cambridge University Press:

08 April 2017, pp. 848-849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography
B Gorman, T Kelly
Published online by Cambridge University Press:

08 April 2017, pp. 850-851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Natural Analogs of Synthetic Reference Materials: Assessing the Limits of Homogeneity Testing at the Picogram Scale
P Michalak, A Renno, S Merchel, F Munnik, M Wiedenbeck
Published online by Cambridge University Press:

08 April 2017, pp. 852-853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Assessing Microanalytical Performance Using Secondary Standards: Results of an Electron Probe Interlaboratory Comparison Using Four Natural Volcanic Glasses
S Kuehn, G Froese, P Shane
Published online by Cambridge University Press:

09 April 2017, pp. 854-855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study
V-D Hodoroaba, R Marinenko, J Small, W Unger
Published online by Cambridge University Press:

08 April 2017, pp. 856-857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Bringing Standardized Processes to Atom-Probe Tomography - Part 1: Establishing Standardized Terminology
E Marquis, I Anderson, F Danoix, R Forbes, B Gault, T Kelly, M Miller, M Moody, F Vurpillot
Published online by Cambridge University Press:

09 April 2017, pp. 858-859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

MSA/MAS Hyper-Dimensional Spectral File Format - A Straw-Man Proposal
M Kundmann, N Wilson, A Torpy, N Zaluzec
Published online by Cambridge University Press:

08 April 2017, pp. 860-861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Applications of Thin-Film Standards in Analytical Electron Microscopy
M Watanabe
Published online by Cambridge University Press:

08 April 2017, pp. 862-863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Remote & Collaborative Instrument Operation for Research, Teaching and Maintenance

Abstract

Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission
S Gautsch, D Parrat, N de Rooij, U Staufer, J-M Marookian, M Hecht, S Vijendran, H Sykulska, W Pike
Published online by Cambridge University Press:

08 April 2017, pp. 864-865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Computer Integrated X-ray Systems and Intelligent Control Systems for Remote Microscopy and Power Savings
R Wuhrer, K Moran
Published online by Cambridge University Press:

08 April 2017, pp. 866-867
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Practical Remote Electron Microscopy - A Vendor's Perspective
T Isabell, N Erdman, V Robertson, I Ishikawa, K Somehara, T Nakamichi
Published online by Cambridge University Press:

09 April 2017, pp. 868-869
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advanced Microscopic Characterisation through Integrated Learning Tools
B Cribb, T White, J Shapter, J Muhling, L Soon, S Ringer, E Grinan, C Frost, P Munroe
Published online by Cambridge University Press:

09 April 2017, pp. 870-871
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

On-Line Scanned Probe Microscopy Transparently Integrated with Twin SEM/FIB Systems
A Lewis, A Ignatov, A Komissar, H Taha, E Maayan
Published online by Cambridge University Press:

09 April 2017, pp. 872-873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Remote Viewing of SEM - A Versatile Tool for Failure Analysts and the Materials Community
C Shah
Published online by Cambridge University Press:

09 April 2017, pp. 874-875
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

Secondary Electron Imaging - Doing it Better
D Joy, B Griffin
Published online by Cambridge University Press:

08 April 2017, pp. 876-877
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Angle and Energy Selective Electron Imaging With an Immersion Lens Cryo-SEM
B Lich, J Greiser, F Morrissey, E Bosch, G Veen, L Roussel, L Tuma
Published online by Cambridge University Press:

08 April 2017, pp. 878-879
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers
C Rodenburg, A Pearson, S Boden
Published online by Cambridge University Press:

09 April 2017, pp. 880-881
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 22 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis Standards

Abstract

An Investigation of “San Carlos Olivine”: Comparing USNM-distributed Material with Commercially Available Material

Microanalysis Standards and Instrumental Calibration: Practical Improvements in Analytical Confidence

The Status of the Smithsonian Microbeam Standards

A U.S. Geological Survey Round Robin for Microanalytical Techniques

Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography

Natural Analogs of Synthetic Reference Materials: Assessing the Limits of Homogeneity Testing at the Picogram Scale

Assessing Microanalytical Performance Using Secondary Standards: Results of an Electron Probe Interlaboratory Comparison Using Four Natural Volcanic Glasses

EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study

Bringing Standardized Processes to Atom-Probe Tomography - Part 1: Establishing Standardized Terminology

MSA/MAS Hyper-Dimensional Spectral File Format - A Straw-Man Proposal

Applications of Thin-Film Standards in Analytical Electron Microscopy

Remote & Collaborative Instrument Operation for Research, Teaching and Maintenance

Abstract

Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission

Computer Integrated X-ray Systems and Intelligent Control Systems for Remote Microscopy and Power Savings

Practical Remote Electron Microscopy - A Vendor's Perspective

Advanced Microscopic Characterisation through Integrated Learning Tools

On-Line Scanned Probe Microscopy Transparently Integrated with Twin SEM/FIB Systems

Remote Viewing of SEM - A Versatile Tool for Failure Analysts and the Materials Community

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

Secondary Electron Imaging - Doing it Better

Angle and Energy Selective Electron Imaging With an Immersion Lens Cryo-SEM

Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis Standards

Abstract

Remote & Collaborative Instrument Operation for Research, Teaching and Maintenance

Abstract

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract