Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 17 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 17 - Supplement S2 - July 2011

Contents

Page 24 of 49

Instrumentation and Techniques

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

  • Detection of Secondary Electrons by Scintillation Detector at VP SEM

  • J Jirak, P Čudek, V Nedela
  • Published online by Cambridge University Press:
    08 April 2017, pp. 922-923
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Construction and Testing of a Dual Faraday Cup for Low Vacuum and Environmental Scanning Electron Microscope

  • S Wight, A Konicek
  • Published online by Cambridge University Press:
    08 April 2017, pp. 924-925
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Helium Ion Microscopy of Cellular Interactions of Nanoparticles

  • B Arey, V Shutthanandan, G Orr
  • Published online by Cambridge University Press:
    08 April 2017, pp. 926-927
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Design and performance of a Near Ultra High Vacuum Helium Ion Microscope

  • R van Gastel, L Barriss, C Sanford, G Hlawacek, L Scipioni, A Merkle, D Voci, C Fenner, H Zandvliet, B Poelsema
  • Published online by Cambridge University Press:
    08 April 2017, pp. 928-929
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors

  • M Konno, Y Suzuki, H Inada, K Nakamura
  • Published online by Cambridge University Press:
    09 April 2017, pp. 930-931
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in 3D Electron Microscopy

Abstract

  • Recent Developments in Quantitative Electron Tomography

  • P Midgley, Z Saghi, J Hindson, R Leary, D Holland, A Sederman, L Gladden, V Schmidt, N Greenham
  • Published online by Cambridge University Press:
    08 April 2017, pp. 932-933
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Ultra-High Resolution Electron Tomography for Materials Science: a Roadmap

  • K Batenburg, S Bals, S Van Aert, T Roelandts, J Sijbers
  • Published online by Cambridge University Press:
    08 April 2017, pp. 934-935
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of Nickel Oxide Nanoplates Using STEM Tomography and In-situ Electron Microscopy

  • A Shukla, P Ercius, A Gautam, J Cabana, U Dahmen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 936-937
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 3-D Tracking and Visualization of Hundreds of Fuel Cell Nanocatalysts During Electrochemical Aging

  • Y Yu, H Xin, R Hovden, D Wang, J Mundy, H Abruña, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 938-939
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Self-Assembly in Suspension

  • H Friedrich
  • Published online by Cambridge University Press:
    08 April 2017, pp. 940-941
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 3D Imaging of Biological Cells Using a CryoFIB/SEM and a CryoTEM

  • K Strunk, T Clark, J Gray, P Zhang
  • Published online by Cambridge University Press:
    08 April 2017, pp. 942-943
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Tomography of Quantum Dot Bioconjugates

  • A Courtis, R Mazitschek, D Bell
  • Published online by Cambridge University Press:
    08 April 2017, pp. 944-945
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 3D Characterization of Nano-Pipes and Nano-Pores in Hematite Particles

  • N Monsegue, T Echigo, D Bharkhada, G Wang, M Murayama
  • Published online by Cambridge University Press:
    08 April 2017, pp. 946-947
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Gold Nanoparticles: 3D-STEM-HAADF Analyses and Plasmonic Studies by EELS

  • R Arenal, L Roiban, O Ersen, J Burgin, M Treger-Delapierre
  • Published online by Cambridge University Press:
    08 April 2017, pp. 948-949
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 3D STEM for Imaging Biological Samples and Nanoparticles

  • A Lupini, S Pennycook, N de Jonge
  • Published online by Cambridge University Press:
    08 April 2017, pp. 950-951
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • STEM Axial Resolution Calculated by Monte Carlo Simulations in Micrometers-Thick Substrates

  • H Demers, D Drouin, N de Jonge
  • Published online by Cambridge University Press:
    08 April 2017, pp. 952-953
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Optimized Tomographic Acquisition and Reconstruction for Highly Faceted Nanostructures with Isotropic Resolution

  • P Ercius
  • Published online by Cambridge University Press:
    08 April 2017, pp. 954-955
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A New Approach to Electron Tomography for The ATOM Project

  • T Petersen, M Miller, T Kelly, K Rajan, S Ringer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 956-957
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Tri-Beam System: Femtosecond Laser Based Tomography in a Dual-Beam FIB

  • M Echlin, A Mottura, T Pollock
  • Published online by Cambridge University Press:
    08 April 2017, pp. 958-959
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 3D EDX Microanalysis by FIB-SEM: Enhancement of Elemental Quantification

  • P Burdet, C Hébert, M Cantoni
  • Published online by Cambridge University Press:
    09 April 2017, pp. 960-961
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 24 of 49