Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
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Volume 17 - Supplement S2 - July 2011

Contents

Page 27 of 49

Instrumentation and Techniques

Effects of Metallographic and Other Preparation Techniques on Microstructural Characterization

Abstract

Effects of Sample Preparation on Electron Probe Microanalysis of Alpha-Plutonium
T Nothwang, A Neuman, F Hampel, F Freibert
Published online by Cambridge University Press:

08 April 2017, pp. 1042-1043
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Electron Probe Microanalysis of Uranium Localization in Alpha-Plutonium
A Neuman, T Nothwang, F Hampel, F Freibert
Published online by Cambridge University Press:

08 April 2017, pp. 1044-1045
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microscopy Characterization of Aqueous PVAC Glue Penetration in Double Coated Paperboard Systems
D Williams, B Ninness, D Ventresca, G Welsch
Published online by Cambridge University Press:

08 April 2017, pp. 1046-1047
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microanalysis of Silver and Gold Nanoparticles Used in Surface-Enhanced Raman Spectrometric Characterization of Aminobiphenyl Isomers
K Donthula, J Miller, B Ooi, N Chong
Published online by Cambridge University Press:

08 April 2017, pp. 1048-1049
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Shape Controllable Synthesis of ZnO Hexagonal Arrays Via Chemical Precipitation
A Medina-Flores, L Béjar-Gómez, G Herrera-Pérez, J Bernal
Published online by Cambridge University Press:

09 April 2017, pp. 1050-1051
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

HRTEM Analysis of Au-Cu Nanoparticles
A Medina-Flores, L Béjar-Gómez, L Zamora, A Medina-Almazán, J Bernal
Published online by Cambridge University Press:

08 April 2017, pp. 1052-1053
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Characterization of ε and γ′ Produced by Microwave
A Medina-Flores, L Béjar-Gómez, J Bernal, J Rubio-Avalos
Published online by Cambridge University Press:

08 April 2017, pp. 1054-1055
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in Electron Crystallography for Materials Research

Abstract

Being Quantitative in Reciprocal Space
L Marks
Published online by Cambridge University Press:

08 April 2017, pp. 1056-1057
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Transmission Diffractive Microscopy Without Lenses at Visible, X-ray and Electron Wavelengths
J Rodenburg, A Maiden, D Batey, F Sweeney, T Edo, A Hurst, F Hüe, P Midgley, P Wang, A Kirkland, M Humphry
Published online by Cambridge University Press:

08 April 2017, pp. 1058-1059
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Electron Diffraction Imaging of Molecular Nanostructures and Molecular Motions
J Zuo, K Ran
Published online by Cambridge University Press:

08 April 2017, pp. 1060-1061
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope Supported by Open-Access Crystallographic Databases
P Moeck, S Rouvimov
Published online by Cambridge University Press:

08 April 2017, pp. 1062-1063
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Microscopy
P Specht, D Barton, J Kang, R Cieslinski, O Dubon, C Kisielowski
Published online by Cambridge University Press:

08 April 2017, pp. 1064-1065
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Structural and Chemical Characterisation of Metal and Metal Oxide Nanoparticles
A Kirkland, S Haigh, N Young, H Sawada, K Takayangi
Published online by Cambridge University Press:

08 April 2017, pp. 1066-1067
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography
J Rouvière, A Béché, T Denneulin, D Cooper
Published online by Cambridge University Press:

08 April 2017, pp. 1068-1069
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Structural Investigations of “Ferecrystals” by Scanning Nanobeam Transmission Electron Diffraction
H Kirmse, C Grosse, I Häusler, P Moeck, S Rouvimov, M Beekman, D Moore, R Atkins, D Johnson, W Neumann
Published online by Cambridge University Press:

08 April 2017, pp. 1070-1071
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Diffraction from Oxide Superlattices - Stacking Sequence Effects in Plan View
J Spence, A Shah, U Weierstall, B Nelson-Cheeseman, A Bhattacharya
Published online by Cambridge University Press:

08 April 2017, pp. 1072-1073
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering
G Pavia, G Benner, H Niebel, E Rauch, M Véron
Published online by Cambridge University Press:

08 April 2017, pp. 1074-1075
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM
E Okunishi, H Sawada, Y Kondo
Published online by Cambridge University Press:

08 April 2017, pp. 1076-1077
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Combining Scanning Transmission Electron Microscopy and Electron Diffraction to Understand the Atomic Structures of Oxide Superlattices
A Shah, B Nelson-Cheeseman, A Bhattacharya, J-M Zuo, J Spence
Published online by Cambridge University Press:

08 April 2017, pp. 1078-1079
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study
S Rajasekhara, K Ganesh, K Hattar, J Knapp, P Ferreira
Published online by Cambridge University Press:

08 April 2017, pp. 1080-1081
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 27 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Effects of Metallographic and Other Preparation Techniques on Microstructural Characterization

Abstract

Effects of Sample Preparation on Electron Probe Microanalysis of Alpha-Plutonium

Electron Probe Microanalysis of Uranium Localization in Alpha-Plutonium

Microscopy Characterization of Aqueous PVAC Glue Penetration in Double Coated Paperboard Systems

Microanalysis of Silver and Gold Nanoparticles Used in Surface-Enhanced Raman Spectrometric Characterization of Aminobiphenyl Isomers

Shape Controllable Synthesis of ZnO Hexagonal Arrays Via Chemical Precipitation

HRTEM Analysis of Au-Cu Nanoparticles

Characterization of ε and γ′ Produced by Microwave

Advances in Electron Crystallography for Materials Research

Abstract

Being Quantitative in Reciprocal Space

Transmission Diffractive Microscopy Without Lenses at Visible, X-ray and Electron Wavelengths

Electron Diffraction Imaging of Molecular Nanostructures and Molecular Motions

Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope Supported by Open-Access Crystallographic Databases

Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Microscopy

Structural and Chemical Characterisation of Metal and Metal Oxide Nanoparticles

Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography

Structural Investigations of “Ferecrystals” by Scanning Nanobeam Transmission Electron Diffraction

Diffraction from Oxide Superlattices - Stacking Sequence Effects in Plan View

Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering

Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM

Combining Scanning Transmission Electron Microscopy and Electron Diffraction to Understand the Atomic Structures of Oxide Superlattices

The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Effects of Metallographic and Other Preparation Techniques on Microstructural Characterization

Abstract

Advances in Electron Crystallography for Materials Research

Abstract