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Volume 17 - Supplement S2 - July 2011

Contents

Page 28 of 49

Instrumentation and Techniques

Advances in Electron Crystallography for Materials Research

Abstract

  • Automated Diffraction Tomography: A New Era for Electron Crystallography

  • A Stewart, E Mugnaioli, T Gorelik, I Andrusenko, U Kolb
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1082-1083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Oxide Surface Crystallography in Electron Microscopy

  • J Ciston, D Su, Y Lin, L Marks, Y Zhu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1084-1085
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microstructure Characterization of Surface Modified 316L Stainless Steel Using an Automated Electron Diffraction Technique in the TEM

  • G Facco, A Kulovits, J Wiezorek
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1088-1089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • D-STEM Combined with Precession Microscopy for Nanoscale Crystal Orientation and Phase Mapping

  • K Ganesh, S Rajasekhara, D Bultreys, K Hattar, J Knapp, P Ferreira
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1090-1091
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-situ Observations of the Complex Crystallization Processes Occurring Laser Heated Amorphous Germanium Films

  • T LaGrange, L Nikolova, M Wall, B Reed, G Campbell, B Siwick, F Rosei
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1092-1093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Processing and Quantification of Polycrystalline Electron Diffraction Patterns

  • X Li
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1096-1097
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope

  • R Hūbner, H-J Engelmann, E Zschech
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1100-1101
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Artificial STEM DI - Visualizing Polycrystalline Regions in High Resolution Images

  • B Schaffer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1102-1103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of Rotation Dark-Field Imaging for Mapping Secondary-Phase Distributions in Nano-Scale

  • M Watanabe, J Cubero, K Edalati, Z Horita
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1104-1105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Modulated Structure of η´-Cu3+x(Si,Ge) Determined by Quantitative Electron Diffraction Tomography

  • L Palatinus, M Klementová, V Dřínek, M Jarošová, V Petříček
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1106-1107
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Strain Measurement of Selective Epitaxial Growth (SEG) SiGe Structure by the Nano Beam Diffraction (NBD) Method

  • S-W Kim, J-H Yoo, S-M Koo, D-H Ko
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1108-1109
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Angular Correlations in Coherent Electron Nanodiffraction of a Metallic Glass

  • J Hwang, Y Kalay, M Kramer, P Voyles
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1110-1111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • On the Consistency of Highly Accurate QCBED Data Refined from Different Zone Axes for Ferromagnetic Tetragonal L10 FePd

  • X Sang, A Kulovits, J Wiezorek
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1112-1113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Determination of a 3D Lattice Displacement Field by Iterative Phase Retrieval of Rocking Curves of HOLZ Reflections

  • K Saitoh, M Hamabe, S Morishita, J Yamasaki, N Tanaka
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1114-1115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Failure of Friedel's Law in Electron Diffraction Scattering in Bilayer Graphene and Graphene with Defects

  • H Kim
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1116-1117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Nanocrystalline Structure of Metal Containing Films in Natural Wetlands

  • P Plachinda, R Smith, S Rouvimov, E Sánchez, P Moeck, R Hugo, C Wang
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1118-1119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Use of KSpaceNavigator as a Tool for Defect Analysis by Diffraction Contrast Microscopy

  • A Gautam, T Duden, U Dahmen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1120-1121
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 28 of 49