Instrumentation and Techniques
Tools for Science
Abstract
Performance and Application of an Aberration Corrected Analytical Electron Microscope with a Cold Field Emission Gun
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1162-1163
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STEM-based Technologies for Nano and Biological Sciences
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1164-1165
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In Situ Material Removal over Many Orders of Magnitude
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 1166-1167
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Advances in EELS Instrumentation: A New Design High-Vacuum Parallel EELS System
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- 08 April 2017, pp. 1168-1169
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Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale
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- 08 April 2017, pp. 1170-1171
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3 Dimensional Microscopy, Large Volume Serial Block Face Imaging in the SEM
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- 08 April 2017, pp. 1172-1173
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Reducing Reagent Consumption and Improving Efficiency of Specimen Fixation and Embedding, Grid Staining and Archiving using mPrep™ Capsule Processing
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- 09 April 2017, pp. 1174-1175
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A to Z of Technology - Software for Better Results with Faster Sensors
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- 08 April 2017, pp. 1176-1177
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Retrofittable Nano-Manipulation Systems for Scanning Electron Microscope
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- 09 April 2017, pp. 1178-1179
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Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1180-1181
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The How and Why of Smart Features
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 1182-1183
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Development of 30-kV Cc/Cs Correction Tandem System
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1184-1185
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Results on 20kV Spectroscopy with Monochromation and In-Column Filter
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1186-1187
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Image Restoration by DOG Multi-Scale Analysis
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1188-1189
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Trials to Improve Image Quality in Electron Tomography
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1190-1191
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Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes
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- 08 April 2017, pp. 1192-1193
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High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer - Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1194-1195
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3D Confocal Raman Imaging of Transparent and Opaque Samples
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1196-1197
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A New Electron Microscope with an Easy Operation System for Nano Analysis
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 1198-1199
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Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 1200-1201
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