Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-27T15:15:30.405Z Has data issue: false hasContentIssue false
  • English
  • Français

3D EDX Microanalysis by FIB-SEM: Enhancement of Elemental Quantification

Published online by Cambridge University Press:  09 April 2017

P Burdet ,
C Hébert  and
M Cantoni
P Burdet
Affiliation:
Federal Institute of Technology of Lausanne, Switzerland
C Hébert
Affiliation:
Federal Institute of Technology of Lausanne, Switzerland
M Cantoni
Affiliation:
Federal Institute of Technology of Lausanne, Switzerland

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 960 - 961
Copyright
Copyright © Microscopy Society of America 2011