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A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations

Published online by Cambridge University Press:  06 March 2019

Geert Brouwer
Geert Brouwer*
Affiliation:
Philips Research Laboratories, Eindhoven / I&E, Almelo The Netherlands
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Extract

The instrument employs a fully-focussing optical system which allows a wide range of sample-orientations and thus permits determination of the preferred-orientation distribution-function. Hence, measured peak-intensifies can be corrected for non-randomness.

The sample performs a planetary motion around the focus of the primary, monochromatic beam. The angle of incidence can be varied over a wide range of values, including both transmission and reflection. The sample can be rotated in its own plane in a controlled manner. Full illumination is obtained in any position of the sample. The diameter of the Rowland-sphere of the powder-optics remains constant and permits the use of a sphericai sample-layer.

Type
VI. XRD Techniques, Instrumentation and P.C. Applications
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 413 - 421
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

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