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Multilayer Scatterers for Use in Polarized X-Ray Flourescence

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt  and
Richard W. Ryon
John D. Zahrt
Affiliation:
Los Alamos National Laboratory
Richard W. Ryon
Affiliation:
Lawrence Livermore National Laboratory
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Extract

In the EDXRF analysis of minor and trace elements in a variety of matrices, the use of a polarized x-ray source incident on a sample will provide minimum detection limits three to five times lower than the use of non-polarized sources (1,2). There are various methods of producing monochromatic polarized x-rays for specimen excitation (3,4,5,6 ). Such x-ray sources may produce the lowest detection limits for a single element or a narrow range of elements. However, if one is interested in simultaneously analyzing a broad range of elements, a polychromatic source is desired (7,8,9). We present here a new method for producing broad-band polarized x-rays.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 435 - 441
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

(1) Ryon, Richard W., Adv. in X-Ray Anal., 20, 575-590 (1977).Google Scholar
(2) Wobrauschek, P., and Aiginger, H., X-Ray Spect. 8, 57–62 (1979).Google Scholar
(3) Sparks, , Jr., Cully, In “Synchrotron Radiation Research”, Winick, H. and Donlaeh, S., eds., Plenum Pub. Corp., 1980.Google Scholar
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(5) Wobrauschek, P., and Aiginger, H., X-Ray Speet., 72-78 (1983).Google Scholar
(6) Zahrt, John D., Adv. in X-Ray Anal. 26, 331–336 (1983).Google Scholar
(7) Ryon, Richard and Zahrt, J., Adv. in X-Ray Anal., 22, 453-60 (1979)Google Scholar
(8) zahrt, John and Richard, Ryon, Adv. in X-Ray Anal., 24, 345-50 (1981).Google Scholar
(9) Zahrt, John D., Adv. in X-Ray Anal., 27, I. (with Richard W. Ryon) 505-511; II. 513-517 (1984).Google Scholar