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Analysis of Aluminum-Nickel Diffusion Couples by X-Ray Absorption

Published online by Cambridge University Press:  06 March 2019

Paul Lublin
Paul Lublin*
Affiliation:
Sylvania Research Laboratories, Bayside, New York
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Abstract

The X-ray technique for analyzing diffusion couples employs a monochromatic X-ray beam which impinges on a very fine slit, a holder for aligning the diffusion zone with the slit, and a scintillation counter for the high counting rates which have to be measured. Sample preparation, experimental instrumentation, and the application of the technique to the aluminum-nickel system will be discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 1 - 10
Copyright
Copyright © International Centre for Diffraction Data 1959

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References

1 Castleman, L. S. and Seigle, L. L.. “Layer Growth during Interdiffusion with Al—Ni Alloy Systems,” Transaction A.I.M.E., Vol. 212, October 1958, p. 589.Google Scholar
2 Fink, W. L. and Willey, L. A., “Constitution of Binary Alloys (Al-Ni),” Metals Handbook A.S.M. 1948, p. 1164.Google Scholar
3 Ogilvie, R. E., “Quantitative Analysis by X-ray Absorption,” Ph.D. Thesis, Department of Metallurgy, Massachusetts Institute of Technology, May 1955.Google Scholar
4Personal communication to L. S. Castleman of Sylvania Research Laboratories.Google Scholar