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The use of UV-C radiation for terminal disinfection of pathogenic Gram-negative rods: a pilot study
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- Journal:
- Antimicrobial Stewardship & Healthcare Epidemiology / Volume 3 / Issue 1 / 2023
- Published online by Cambridge University Press:
- 21 December 2023, e247
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Impact of sedentary behavior and emotional support on prenatal psychological distress and birth outcomes during the COVID-19 pandemic
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- Psychological Medicine / Volume 53 / Issue 14 / October 2023
- Published online by Cambridge University Press:
- 08 March 2023, pp. 6792-6805
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SIMS Study of C, O and N Impurity Contamination for Multi-Crystalline Si Solar Cells
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- MRS Online Proceedings Library Archive / Volume 1123 / 2008
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- 21 March 2011, 1123-P01-06
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- 2008
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Quantitative Measurement of Boron and Phosphorus in Solar Grade Silicon Feedstocks by High Resolution Fast-Flow Glow-Discharge Mass Spectrometry
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- MRS Online Proceedings Library Archive / Volume 1123 / 2008
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- 21 March 2011, 1123-P01-08
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- 2008
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A Comparison of Magnesium and Beryllium Acceptors in GaN Grown by rf-Plasma Assisted Molecular Beam Epitaxy
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- MRS Online Proceedings Library Archive / Volume 639 / 2000
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- 17 March 2011, G3.3
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- 2000
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An Update on Standards Activity for Txrf and the Challenges Ahead
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 767-770
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- 1995
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Submicron, Noble Metal Particle Reference Standards: A Proposal
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- MRS Online Proceedings Library Archive / Volume 386 / 1995
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- 15 February 2011, 189
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- 1995
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Trace Analysis by TXRF
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- Advances in X-ray Analysis / Volume 38 / 1994
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- 06 March 2019, pp. 687-690
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- 1994
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Total Reflection X-Ray Fluorescence (TXRF)
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- MRS Online Proceedings Library Archive / Volume 354 / 1994
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- 21 February 2011, 377
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- 1994
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Characterization Of Inorganic Contamination In Liquid Crystal Display Materials Using Total Reflection X-Ray Fluorescence (TXRF)
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- MRS Online Proceedings Library Archive / Volume 345 / 1994
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- 15 February 2011, 223
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- 1994
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Txrf Semiconductor Applications
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 565-575
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- 1993
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TXRF Characterization of Trace Metal Contamination in Thin Gate Oxides
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- MRS Online Proceedings Library Archive / Volume 259 / 1992
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- 25 February 2011, 173
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- 1992
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Investigations of Residual Chlorine on Etched AlCu Metal Lines by Total Reflection X-Ray Fluorescence (TXRF)
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- MRS Online Proceedings Library Archive / Volume 225 / 1991
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- 15 February 2011, 329
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- 1991
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The Correlation between Quantitative Surface Metallic Contamination and RTP-Induced Surface Defects
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- MRS Online Proceedings Library Archive / Volume 146 / 1989
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- 25 February 2011, 377
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- 1989
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Characterization of Heavy Metal Contamination in Diamond Films Using Sims, Txrf, and RBS
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- MRS Online Proceedings Library Archive / Volume 162 / 1989
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- 26 February 2011, 261
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- 1989
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The Redistribution of Impurities Under RTP for Polysilicon Capped Silicon
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- MRS Online Proceedings Library Archive / Volume 92 / 1987
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- 28 February 2011, 41
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- 1987
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Direct Comparison of FTIR and SIMS Calibrations for [O] in Silicon
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- MRS Online Proceedings Library Archive / Volume 59 / 1985
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- 28 February 2011, 67
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- 1985
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Oxygen and Carbon Defect Characterization In Silicon by Sims
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- MRS Online Proceedings Library Archive / Volume 59 / 1985
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- 28 February 2011, 433
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- 1985
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SIMS Measurements of Oxygen in Heavily-Doped Silicon
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- MRS Online Proceedings Library Archive / Volume 59 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 73
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- 1985
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