21 results
A relief with Mithraic scenes on a sarcophagus lid: iconographic and literary issues
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- Journal:
- Libyan Studies / Volume 53 / November 2022
- Published online by Cambridge University Press:
- 11 July 2022, pp. 16-36
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- November 2022
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Gender and Time-Related Differences in a Large Cohort of Heavy Smokers Applying for Treatment to a Tobacco Centre in Italy
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- Journal:
- Journal of Smoking Cessation / Volume 13 / Issue 3 / September 2018
- Published online by Cambridge University Press:
- 25 July 2017, pp. 121-128
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- September 2018
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Dual-Lens Electron Holography for Junction Profiling and Strain Mapping of Semiconductor Devices
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- Journal:
- Microscopy Today / Volume 22 / Issue 3 / May 2014
- Published online by Cambridge University Press:
- 13 May 2014, pp. 28-35
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- May 2014
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Channel Strain Characterization in Semiconductor Device by Techniques Based on Transmission Electron Microscope
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1349 / 2011
- Published online by Cambridge University Press:
- 13 September 2011, mrss11-1349-dd04-03
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- 2011
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Strain Mapping on Semiconductor Device by Dark Field Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 590-591
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- July 2010
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Stress and Strain Measurements in Semiconductor Device Channel Areas by Convergent Beam Electron Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 913 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0913-D05-03
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- 2006
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Electron Holography with Variable Magnification for Semiconductor Device Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 564-565
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- August 2005
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Stress Generation in PECVD Silicon Nitride Thin Films for Microelectronics Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 863 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, B7.9/O11.9
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- 2005
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Variable Magnification Electron Holography for 2-D Mapping of Semiconductor Devices
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- Journal:
- Microscopy Today / Volume 12 / Issue 6 / November 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 20-25
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- November 2004
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A Survey of Defects in Strained Si Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 809 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, B1.5
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- 2004
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Image Processing Methodology for Determining SI Precipitate Size and Density in Oxide Layers from Conical Dark Field TEM Micrographs
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 832-833
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- August 2001
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Diffusion and Defect Structure in Nitrogen Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 669 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, J6.4
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- 2001
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Non Destructive Determination of the Threading Dislocation Density of Smooth Simox Substrates using Atomic Force Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1088-1089
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- August 2000
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FIB Dimpling: A Method for Preparing Plan-View TEM Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 506-507
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- August 2000
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A Two-Step Spacer Etch for High-Aspect-Ratio Gate Stack Process
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- Journal:
- MRS Online Proceedings Library Archive / Volume 611 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, C5.4.1
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- 2000
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Diffusion Barriers for Mobile Ions in 256M DRAMs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 564 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 229
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- 1999
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Transient Enhanced Diffusion and Dose Loss of Indium in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 568 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 205
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- 1999
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Nitrogen Implantation and Diffusion in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 568 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 277
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- 1999
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Characterization of Electrically Pulsed Chromium Disilicide Fusible Links
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- Journal:
- MRS Online Proceedings Library Archive / Volume 523 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 103
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- 1998
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Atomic Resolution Electronic Structure in Device Development
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 645-646
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- August 1997
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