Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Abstract

Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale

On-axis Transmission Kikuchi Diffraction for Orientation Mapping of Nanocrystalline Materials in the SEM

The Influence of Microscope and Specimen Parameters on the Spatial Resolution of Transmission Kikuchi Diffraction

Crystallographic Orientation Image Mapping with Multiple Detector Configurations at 30 - 300 kV

Three-Dimensional Analysis of Cracks by Focused Ion Beam and Transmission Kikuchi Diffraction

Investigating Stress-Assisted Grain Growth in Nanocrystalline Materials Using in-situ Transmission Kikuchi Diffraction

Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns

Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM -a New Nano-Analysis Tool for a Large-Scale Application

Applications of Multivariate Statistical Methods to Analysis of Electron Backscatter Diffraction and Transmission Kikuchi Diffraction Datasets

Comparison of Dislocation Mapping Using Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction

Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope

Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM

Crystallographic Orientation Maps Obtained from Ion and Backscattered Electron Channeling Contrast

Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems

Challenges Associated with Transmission Experiments in the SEM

Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging

Advancing Correlative STEM Analysis Methods for FE-SEM

Automated Serial Section Large-field Transmission-Mode Scanning Electron Microscopy (tSEM) for Volume Analysis of Hippocampus Ultrastructure

Improved Image Quality in SEM Imaging of Thin Tissue Sections

Electron Channelling Contrast Imaging (ECCI): An Amazing Tool for Observations of Crystal Lattice Defects in Bulk Samples

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Abstract