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Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM -a New Nano-Analysis Tool for a Large-Scale Application
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 542 - 543
- Copyright
- © Microscopy Society of America 2017
References
[5] This work was supported by the SETNanoMetro Seventh Framework Programme project (project number 604577; call identifier FP7-NMP-2013_LARGE-7). Thanks to Pawel Nowakowski from E. A. Fischione Instruments, Inc. for careful polishing of our samples.Google Scholar