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Crystallographic Orientation Image Mapping with Multiple Detector Configurations at 30 - 300 kV

Published online by Cambridge University Press:  04 August 2017

Joshua D. Sugar
Affiliation:
Sandia National Laboratories, Livermore, CA, USA.
Joseph T. McKeown
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA, USA.
Daniel C. Bufford
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA.
Joseph R. Michael
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Dingley, D. J. & Randle, V. Journal of Materials Science 27 1992). p. 45454566.Google Scholar
[2] Nishikawa, S. & Kikuchi, S. Nature 121 1928). p. 10191020.Google Scholar
[3] Lassen, N. C. K., et al., Scanning Microscopy 6 1992). p. 115121.Google Scholar
[4] Rauch, E. F. & Dupuy, L. Archives of Metallurgy and Materials 50 2005). p. 8799.Google Scholar
[5] Wright, S. I. & Dingley, D. J. Texture and Anisotropy of Polycrystals 273–2 1998). p. 209214.Google Scholar
[6] Zaefferer, S. Journal of Applied Crystallography 33 2000). p. 1025.Google Scholar
[7] Sandia National Laboratories is a multi-mission laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000..Google Scholar