Microscopy and Microanalysis: Volume 23 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract

Atomic Resolution Microscopy of Clathrate-I Type Borosilicides

Standards, Reference Materials, and Their Applications in Quantitative Microanalysis

Abstract

Current Status of ISO/TC202 - Microbeam Analysis

USGS Microanalytical Reference Materials (MRMs) Development

Natural and Synthetic Glass and Crystal Reference Materials for Trace Element Microanalysis

Use of Mineral Reference Standards in EPMA: Instrumental Calibration, Standards Comparison, and Quality Control

Status of the Smithsonian Microbeam Standards 2017 With a Discussion of the Venerable VG-2 Basalt Glass

Relative uncertainties in mass attenuation coefficients and their influence on quantitative EDS and WDS analysis

Minerals from the Kakanui Volcanic Breccia: A 2017 Look at Geological Reference Materials for EPMA

Application of SIMS-SSAMS to Characterization of Surrogate Pre- and Post-Detonation Urban Debris Standard Reference Materials.

£ Factor and k-Factor Determination Using Needle Samples

Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis

Thoughts on Standards Materials and Analytical Routines for Electron Backscatter Diffraction (EBSD)

Standardless EDS Composition Analysis using Quantitative Annular Dark-Field Imaging

Practical Utilization of Uranium-Containing Particulate Test Samples for SEM/EDS and SIMS Automated Particle Analysis Method Validation

Measuring Carbon in Steel Using Calibration Curves on the Microprobe; Failed Cap Screw Study

Inspection Tool for Testing an Electron Beam in an Electromagnetic Lens System

Collection Efficiency of the Twin EDS Detectors for Quantitative X-ray Analysis on A New Probe-Corrected TEM/STEM

Focused Interest Group on Microanalytical Standards (FIGMAS): An Update

Rare Earth Orthophosphate Reference Materials From Na2CO3-MoO3 Flux: New Synthetic Procedures and Trace Element Determinations

Microprobe Analysis of Pu-Ga Standards

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract

Standards, Reference Materials, and Their Applications in Quantitative Microanalysis

Abstract