Current Status of ISO/TC202 - Microbeam Analysis

Patrick Camus; Douglas Meier; Ryna Marinenko

doi:10.1017/S1431927617003130

Current Status of ISO/TC202 - Microbeam Analysis

Published online by Cambridge University Press: 04 August 2017

Patrick Camus ,

Douglas Meier and

Ryna Marinenko

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Patrick Camus: Affiliation:
EDAX Inc., A Division of Ametek, 91 McKee Place, Mahwah, NJ
Douglas Meier: Affiliation:
McCrone Associates, Inc., 850 Pasquinelli Drive, Westmont, IL
Ryna Marinenko: Affiliation:
NIST; MS 8371, 100 Bureau Dr., Gaithersburg, MD

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 490 - 491

DOI: https://doi.org/10.1017/S1431927617003130 [Opens in a new window]

References

[1] http://www.iso.ore/iso/home/search.htm?qt=microbeam&published=on&active tab=standard s&sort_by=rel or http://www.iso.org/iso/home/store/catalogue tc/catalogue tc browse.htm?commid=54674.Google Scholar

[2] http://www.iso.org/iso/home/standards_development/list_of_iso_technical_committees/iso_te chnical committee.htm?commid=54674.Google Scholar

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Current Status of ISO/TC202 - Microbeam Analysis

Abstract

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