Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-23T08:27:41.071Z Has data issue: false hasContentIssue false
  • English
  • Français

Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis

Published online by Cambridge University Press:  04 August 2017

John M. Hanchar
John M. Hanchar*
Affiliation:
Department of Earth Sciences, Memorial University of Newfoundland, St. John’s, NL A1B 3X5Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 508 - 509
Copyright
© Microscopy Society of America 2017 

References

[1] Hanchar, JM, Finch, RJ, Hoskin, PWO, Watson, EB, Cherniak, DJ & Mariano, AN American Mineralogist 86 2001). p 667–680.CrossRefGoogle Scholar
[2] Mikova, J, Kosler, J, Longerich, HP, Wiedenbeck, M & Hanchar, JM Journal of Analytical Atomic Spectrometry 24 2009 1244–1252. doi: 10.1039/b900276f.Google Scholar