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Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM

  • Joseph Tessmer (a1), Saransh Singh (a1), Yoosuf N. Picard (a1) and Marc DeGraef (a1)
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[1] Singh, S. & De Graef, M. Microscopy and Microanalysis 2017). in press.
[2] Callahan, P. & De Graef, M. Microscopy and Microanalysis 19 2013). p. 1255.
[3] Picard, Y., et al, Microscopy Today 20.02 2012). p. 12.
[4] Research supported by an ONR grant, # N00014-16-1-2821. The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785..

Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM

  • Joseph Tessmer (a1), Saransh Singh (a1), Yoosuf N. Picard (a1) and Marc DeGraef (a1)

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