Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Abstract

Zooming in on Field Evaporation Behavior: A Time Depending Density Functional Theory Study

Correlative TEM and Atom Probe Tomography - A Case Study on Structural Materials for Fusion Reactors

A Methodology for Investigation of Grain-Boundary Diffusion and Segregation

Tracking Structural Modifications from In-Situ Atom Probe Gas-Solid Reactions through Computational Homology

Visualizing and Quantifying Spinodal Decomposition in a Duplex Stainless Steel

Automated Crystallographic Identification of Atom Probe's Ion Desorption Map

An Open-Access Atom Probe Tomography Mass Spectrum Database

Applications of Atom Probe Tomography

Abstract

Application of Atom Probe Tomography to Nitride Semiconductors

Correlated Transmission Electron Microscopy and Atom Probe Tomography study of Boron distribution in BGaN

Exploration of Doped Semiconductors at the Atomic Scale

Correlative Transmission EBSD-APT Analysis of Grain Boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 Based Thin-film Solar Cells

Nanoscale Chemical Imaging of Coking Mechanisms in a Zeolite ZSM-5 Crystal by Atom Probe Tomography

Atom Probe Tomography of Human Tooth Enamel and the Accurate Identification of Magnesium and Carbon in the Mass Spectrum

Distinguishing Meteoritic Nanodiamonds from Amorphous Carbon Using Atom-probe Tomography

Atomic Elemental Tomography of Heavy Element Biomaterials

Metallic nanoshell for three-dimensional chemical mapping of low conductive materials with pulsed-voltage atom probe tomography

Nanoscale Chemical Variations at Boundaries in a BaCe0.8Y0.2O3-δ – Ce0.8Y0.2O3-δ Dual Phase Hydrogen Separation Membrane

3DAP/TEM Study of Precipitation Hardened Magnesium Alloys

Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films

On the Dose Rate Dependence of Cr Clustering in Ion-Irradiated Fe-18Cr Alloys

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Abstract

Applications of Atom Probe Tomography

Abstract