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Metallic nanoshell for three-dimensional chemical mapping of low conductive materials with pulsed-voltage atom probe tomography

Published online by Cambridge University Press:  04 August 2017

Vahid R Adineh ,
Ross K W Marceau  and
Jing Fu
Vahid R Adineh
Affiliation:
Department of Mechanical Engineering, Monash University, Clayton, VIC 3800, Australia
Ross K W Marceau
Affiliation:
Deakin University, Institute for Frontier Materials, Geelong, VIC 3216, Australia.
Jing Fu
Affiliation:
Department of Mechanical Engineering, Monash University, Clayton, VIC 3800, Australia

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 682 - 683
Copyright
© Microscopy Society of America 2017 

References

[1] Gordon, LM & Joester, D Nature 469 2011). p. 194–197.Google Scholar
[2] Kelly, T F, et al, MRS bulletin 34 2009). p. 744–750.CrossRefGoogle Scholar
[3] Adineh, VR, et al, Nano Letters 374 2016). p. 7113–7120.Google Scholar
[4] The authors acknowledge use of facilities within the Monash Centre for Electron Microscopy (MCEM) as well as Institute for Frontier Materials (IFM) - Deakin University. This study was funded by Monash University Interdisciplinary Research (IDR) Seed Fund and the Monash Centre for Atomically Thin Materials (MCATM) for the PhD top-up scholarship.Google Scholar