Materials Science Applications
Automated Inclusion Microanalysis in Steel by Computer-Based Scanning Electron Microscopy: Accelerating Voltage, Backscattered Electron Image Quality, and Analysis Time
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- 10 November 2017, pp. 1082-1090
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Hardware
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing
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- 08 February 2017, pp. 221-226
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Materials Science Applications
Mitigating Curtaining Artifacts During Ga FIB TEM Lamella Preparation of a 14 nm FinFET Device
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- 20 March 2017, pp. 484-490
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Instrumentation and Software
Atomic-Scale Analytical Tomography†
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- 23 February 2017, pp. 34-45
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Materials Science Applications
Three-Dimensional Nanoscale Mapping of State-of-the-Art Field-Effect Transistors (FinFETs)
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- 31 August 2017, pp. 916-925
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Precipitation of (Si2−xAlx)Hf in an Al–Si–Mg–Hf Alloy
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- 20 June 2017, pp. 724-729
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Selectively Electron-Transparent Microstamping Toward Concurrent Digital Image Correlation and High-Angular Resolution Electron Backscatter Diffraction (EBSD) Analysis
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- 04 December 2017, pp. 1091-1095
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Analytical and Instrumentation Science Symposia
Vendor Symposium
Abstract
ZEISS Crossbeam - Advancing Capabilities in High Throughput 3D Analysis and Sample Preparation
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- 04 August 2017, pp. 8-9
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Materials Science Applications
Mapping Chemical Bonds in Semiconductor Devices by Monitoring the Shifts of EELS Edges
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- 29 August 2017, pp. 926-931
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Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns
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- 08 August 2017, pp. 730-740
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Hardware
Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments
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- 26 April 2017, pp. 227-237
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Materials Science Applications
Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)
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- 28 December 2017, pp. 1096-1106
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Overcoming Peak Overlaps in Titanium- and Vanadium-Bearing Materials with Multiple Linear Least Squares Fitting
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- 10 March 2017, pp. 491-500
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Biological Applications
Visualization of Cellular Components in a Mammalian Cell with Liquid-Cell Transmission Electron Microscopy
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- 31 January 2017, pp. 46-55
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Analytical and Instrumentation Science Symposia
Vendor Symposium
Abstract
A Dedicated Backscattered Electron Detector for High Speed Imaging and Defect Inspection
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- 04 August 2017, pp. 10-11
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Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling
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- 04 August 2017, pp. 12-13
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Reconstruction
Reflections on the Projection of Ions in Atom Probe Tomography
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- 02 February 2017, pp. 238-246
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Materials Science Applications
Practical Aspects of Electrochemical Corrosion Measurements During In Situ Analytical Transmission Electron Microscopy (TEM) of Austenitic Stainless Steel in Aqueous Media
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- 08 August 2017, pp. 741-750
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Biological Applications
A Dual Laser Scanning Confocal and Transmission Electron Microscopy Analysis of the Intracellular Localization, Aggregation and Particle Formation of African Horse Sickness Virus Major Core Protein VP7
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- 23 January 2017, pp. 56-68
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Materials Science Applications
In Situ High-Resolution Transmission Electron Microscopy (TEM) Observation of Sn Nanoparticles on SnO2 Nanotubes Under Lithiation
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- 08 December 2017, pp. 1107-1115
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