Skip to main content Accessibility help
×
Home

Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling

Published online by Cambridge University Press:  04 August 2017

P. Nowakowski
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
M.L. Ray
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
P.E. Fischione
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this article
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Zaefferer, S & Wright, SI in Electron backscatter diffraction in materials science (eds. AJ Schwartzet al Springer Bostonp. 109.Google Scholar
[2] Birosca, S, et al, Acta Mater. 59 2011). p. 1510.CrossRefGoogle Scholar
[3] Zaefferer, S, Wright, SI & Raabe, D Metall. Mater. Trans. 39 2008). p. 374.CrossRefGoogle Scholar
[4] Khorashadizadeh, A, et al, Adv. Eng. Mater. 13 2011). p. 237.CrossRefGoogle Scholar
[5] Burnett, TL, et al, Ultramicroscopy 161 2016). p. 119.CrossRefGoogle Scholar
[6] Saowadee, N, Agersted, K & Bowen, JR Jour. Microsc. (Oxford, U.K.) 246 2012). p. 279.CrossRefGoogle Scholar
[7] Lin, FX, et al, Mat. Charact 61 2010). p. 1203.CrossRefGoogle Scholar
[8] Nowakowski, P, et al, Microsc. Microanal. 22 2016). p. 12.CrossRefGoogle Scholar
[9] Nowakowski, P, et al, European Microscopy Congress Proceedings 2016). p. 1082.Google Scholar

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 164 *
View data table for this chart

* Views captured on Cambridge Core between 04th August 2017 - 25th January 2021. This data will be updated every 24 hours.

Access
Hostname: page-component-898fc554b-fznx4 Total loading time: 0.348 Render date: 2021-01-25T12:19:14.613Z Query parameters: { "hasAccess": "1", "openAccess": "0", "isLogged": "0", "lang": "en" } Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false }

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling
Available formats
×
×

Reply to: Submit a response


Your details


Conflicting interests

Do you have any conflicting interests? *