Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

In Situ and Operando Imaging of the Evolution of Battery Materials and Interfaces

Correlative relationship between nanomorphology, crystallinity, texture and device efficiency of organic BHJ solar cells studied by energy-filtered TEM

Processing of Electroactive Ceramics in the Transmission Electron Microscope

4D-STEM Determination of Atomic Structure of Amorphous Materials for Renewable Energy Applications

Examining Partial Crystallization in the Co(78-x)Fe2MnxB14Si2Nb4 Magnetic Amorphous Nanocomposite Alloy Series

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Enhanced Atom Probe Imaging using Generalised Field Evaporation Models

A Machine Learning Approach to Cluster Characterization for Atom Probe Tomography

On the Voltage and Bowl Correction of Trigger-Uncorrelated Multihit Events

Isotopic Analysis of Irradiated Ceramic Fuel for Burnup and Microchemical Assessment Using Atom Probe Tomography.

Evaporation Dynamics of Boron Dopants in Silicon

Analytical Sciences Symposia

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing

Alternative Post-FIB Polishing Using Low-Energy Argon Ion Milling to Prevent Grid Redeposition

The combined use of SEM, EPMA and FIB for the characterization of novel biomaterials for bone regeneration

Electron Irradiation Cleaning of the SEM and its Samples

Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices

Evaluation of Gallium Ion\Xe Plasma Beam for Patterning of Suspended Silicon Nitride Membranes

Operando Investigation of Energy Storage Material by FIB-SEM System

Investigation of the effect of gallium ion (Ga+) irradiation on the fluorescence properties of synthetic microdiamonds

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Hierarchically Structured Classification of Carbon Nanostructures from TEM Images by Machine Learning and Computer Vision

Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks

Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Analytical Sciences Symposia

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy