Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-25T04:40:09.995Z Has data issue: false hasContentIssue false
  • English
  • Français

Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices

Published online by Cambridge University Press:  30 July 2021

Benson Athey ,
Krishnamurthy Mahalingam ,
Sabyasachi Ganguli ,
Albert Hilton  and
Rohan Dhall
Benson Athey
Affiliation:
UES, Inc., Dayton,, Ohio, United States
Krishnamurthy Mahalingam
Affiliation:
UES, Inc., Dayton,, Ohio, United States
Sabyasachi Ganguli
Affiliation:
Air Force Research Laboratory, United States
Albert Hilton
Affiliation:
KBR, Beavercreek,, Ohio, United States
Rohan Dhall
Affiliation:
Lawrence Berkeley National Laboratory, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 436 - 437
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America