Microscopy and Microanalysis: Volume 27 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 27 - August 2021

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Complementary use of high-resolution and high-precision cryo-ED and EM

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Focused ion beam deposited carbon-platinum nanowires for cryogenic resistive thermometry

Developing Higher Quality Conductors and Insulators to Enable Fieldable FIB edits to Complex Microelectronics

Identification of topological magnetic order in a Weyl line ferromagnet

Novel thin film lift-off process for in situ TEM tensile characterization

Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy

Microscopy and Microanalysis for Real World Problem Solving

Manipulation of single atoms and molecules by electron probe and mechanical force

Single Molecule Microscopic Detection of Corrosion Reactions using “Turned-on” Fluorophores

Correlative Imaging of Mesoporous Perovskite Carbon Stack Solar Devices for Defect Evaluation.

Integrated microscopic analysis of lamellar structure in isotactic polypropylene spherulite at nanoscale

Direct imaging of skyrmion in plan-view of a polycrystalline FeGe thin film

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

In Situ Observations of the Dynamics of Pd@Pt Core-Shell Nanoparticles in Electrolyte

Elucidating Cathodic Corrosion Mechanisms with Operando Electrochemical Liquid-Cell STEM in Multiple Dimensions

In-situ Electron Microscopy Observation of Initiation and Propagation of Wet H2S Corrosion on Steel

In-Situ TEM Studies of High Entropy Alloy Nanoparticles Under Gas/Liquid Environment

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Dynamic automation in transmission electron microscopy: application to electron holography

Automatic Hologram Acquisition of Pt Catalyst Nanoparticles on TiO2 Using Particle Detection with Image Processing and AI Classification

Reconstructing the exit wave in high-resolution transmission electron microscopy using machine learning

Routine collection of 10,000 direct detector movies a day using Leginon

Developing Deep Neural Network-based Denoising Techniques for Time-Resolved In Situ TEM of Catalyst Nanoparticles

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 27 - August 2021

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Microscopy and Microanalysis for Real World Problem Solving

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy